Characterization of silicon wafers through deposition of self-assembled monolayers
2000 ◽
Vol 368
(5)
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pp. 434-438
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2009 ◽
Vol 25
(1)
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pp. 83-86
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1999 ◽
Vol 77
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pp. 1077-1084
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2008 ◽
Vol 619-620
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pp. 87-97
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2008 ◽
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pp. 1140-1143
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2007 ◽
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