Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene

2007 ◽  
Vol 111 (27) ◽  
pp. 7711-7714 ◽  
Author(s):  
Michael Jaquith ◽  
Erik M. Muller ◽  
John A. Marohn
Keyword(s):  
Charge Trapping ◽  
Electric Force ◽  
Time Resolved ◽  
Force Microscopy ◽  
Electric Force Microscopy

Following Chemical Charge Trapping in Pentacene Thin Films by Selective Impurity Doping and Wavelength-Resolved Electric Force Microscopy

2012 ◽  
Vol 22 (24) ◽  
pp. 5096-5106 ◽  
Author(s):  
Louisa M. Smieska ◽  
Vladimir A. Pozdin ◽  
Justin L. Luria ◽  
Richard G. Hennig ◽  
Melissa A. Hines ◽  
...  
Keyword(s):  
Thin Films ◽  
Charge Trapping ◽  
Electric Force ◽  
Force Microscopy ◽  
Impurity Doping ◽  
Electric Force Microscopy

Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy

2021 ◽  
Vol 92 (2) ◽  
pp. 023703
Author(s):  
Khaled Kaja ◽  
Denis Mariolle ◽  
Nicolas Chevalier ◽  
Adnan Naja ◽  
Mustapha Jouiad
Keyword(s):  
Electrical Properties ◽  
Spatial Resolution ◽  
Electric Force ◽  
Force Microscopy ◽  
Electric Force Microscopy

Subsurface characterization of carbon nanotubes in polymer composites via quantitative electric force microscopy

2010 ◽  
Vol 21 (22) ◽  
pp. 225702 ◽  
Author(s):  
Minhua Zhao ◽  
Xiaohong Gu ◽  
Sharon E Lowther ◽  
Cheol Park ◽  
Y C Jean ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Polymer Composites ◽  
Electric Force ◽  
Force Microscopy ◽  
Subsurface Characterization ◽  
Electric Force Microscopy

scholarly journals Surface band bending in as-grown and plasma-treated n-type GaN films using surface potential electric force microscopy

2004 ◽  
Vol 84 (16) ◽  
pp. 3070-3072 ◽  
Author(s):  
Sang-Jun Cho ◽  
Seydi Doğan ◽  
Shahriar Sabuktagin ◽  
Michael A. Reshchikov ◽  
Daniel K. Johnstone ◽  
...  
Keyword(s):  
Surface Potential ◽  
Electric Force ◽  
Surface Band ◽  
Band Bending ◽  
Force Microscopy ◽  
Electric Force Microscopy
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