Electrochemistry of Conductive Polymers. 33. Electrical and Optical Properties of Electrochemically Deposited Poly(3-methylthiophene) Films Employing Current-Sensing Atomic Force Microscopy and Reflectance Spectroscopy

2004 ◽  
Vol 108 (42) ◽  
pp. 16365-16371 ◽  
Author(s):  
Hyo Joong Lee ◽  
Su-Moon Park
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Conductive Polymers ◽  
Reflectance Spectroscopy ◽  
Electrical And Optical Properties ◽  
Current Sensing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemically Deposited

Interfacial Roughness in GaAs/A1GaAs Multilayers: Influence of Controlled Impurity Addition

1994 ◽  
Vol 332 ◽  
Author(s):  
S. Nayak ◽  
J.M. Redwing ◽  
T.F. Kuech ◽  
D.E. Savage ◽  
M.G. Lagally
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Correlation Length ◽  
Interfacial Structure ◽  
X Ray Diffraction ◽  
Electrical And Optical Properties ◽  
Interfacial Roughness ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Impurities at heterointerfaces can alter the interfacial structure resulting in changes in physical, electrical and optical properties. We present a study of the interfacial roughness of GaAs/A1xGa1-xAs superlattices which were grown using controlled addition of oxygen at the interface. The interfacial properties were characterized by x-ray diffraction. The morphology of the surface was determined by Atomic Force Microscopy (AFM). X-ray diffraction measurements, both θ-2θ and rocking curves, were used to analyze the correlated and uncorrelated component of the interfacial roughness. A strong difference in the interfacial roughness was observed depending on whether the intentional oxygen incorporation occurred at the GaAs-to-A1GaAs interface or at both interfaces. When oxygen is incorporated at both interfaces, the x- ray reflectivity of the superlattice is decreased considerably resulting from a much higher interfacial roughness. The substrate miscut has a significant effect on RMS roughness, correlated roughness and its correlation length when oxygen is incorporated at the GaAs-to-A1xGa1-xAs interface.

Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

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