Scanning Tunneling Microscope-Based Replacement Lithography on Self-Assembled Monolayers. Investigation of the Relationship between Monolayer Structure and Replacement Bias†
2004 ◽
Vol 108
(25)
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pp. 8581-8583
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1997 ◽
Vol 101
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pp. 9263-9269
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1991 ◽
Vol 30
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pp. 569-572
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2002 ◽
Vol 14
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pp. 154-157
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2010 ◽
Vol 16
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pp. 470-471
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2007 ◽
Vol 121-123
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pp. 495-498
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