Adjacent Effect on Positive Charge Transfer from Radical Cation ofn-Dodecane to Scavenger Studied by Picosecond Pulse Radiolysis, Statistical Model, and Monte Carlo Simulation

2004 ◽  
Vol 108 (9) ◽  
pp. 1475-1481 ◽  
Author(s):  
Akinori Saeki ◽  
Takahiro Kozawa ◽  
Yoichi Yoshida ◽  
Seiichi Tagawa
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Charge Transfer ◽  
Statistical Model ◽  
Radical Cation ◽  
Pulse Radiolysis ◽  
Positive Charge ◽  
Picosecond Pulse

Charge-transfer gap from a Monte Carlo simulation of the three-band hubbard model

1990 ◽  
Vol 165-166 ◽  
pp. 1015-1016 ◽  
Author(s):  
G. Dopf ◽  
T. Kraft ◽  
A. Muramatsu ◽  
W. Hanke
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Charge Transfer ◽  
Hubbard Model

scholarly journals Monte Carlo simulation and thermodynamic integration applied to protein charge transfer

2020 ◽  
Vol 41 (11) ◽  
pp. 1105-1115
Author(s):  
Jan Kaiser ◽  
Mike Castellano ◽  
David Gnandt ◽  
Thorsten Koslowski
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Charge Transfer ◽  
Thermodynamic Integration ◽  
Protein Charge

Improved Current Statistic Model and Adaptive Filtering

2005 ◽  
Author(s):  
Hongtao Hu ◽  
Zhongliang Jing
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Statistical Model ◽  
Adaptive Filtering ◽  
Adaptive Algorithm ◽  
Tracking Algorithm ◽  
Unscented Transformation ◽  
Maneuvering Targets ◽  
Statistic Model ◽  
Simulation Results

Current statistical model needs to pre-define the value of maximum accelerations of maneuvering targets. So it may be difficult to meet all maneuvering conditions. In this paper a novel adaptive algorithm for tracking maneuvering targets is proposed. The algorithm is implemented with fuzzy-controlled current statistic model adaptive filtering and unscented transformation. The Monte Carlo simulation results show that this method outperforms the conventional tracking algorithm based on current statistical model.

Statistical Model for the Inherent Tilt of Flip-Chips

1996 ◽  
Vol 118 (1) ◽  
pp. 16-20 ◽  
Author(s):  
Lewis S. Goldmann
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Statistical Model ◽  
Closed Form ◽  
High Power ◽  
Power Electronic ◽  
Mathematical Algorithm ◽  
Flip Chips ◽  
Statistical Variation ◽  
Analytical Tools

The tilt of flip-chips is becoming increasingly important in optical and high-power electronic applications. This paper outlines the principal sources of tilt, and presents a mathematical algorithm for the statistical variation in inherent tilt, the component related to variability of solder pad dimensions. With the assistance of a Monte Carlo simulation, closed form equations are developed for several common families of symmetric pad footprints. Possible extension of the analytical tools to other important cases is discussed.

Sign in / Sign up

Export Citation Format

Share Document