Nanoscale Imaging of the Electronic Conductivity of the Native Oxide Film on Titanium Using Conducting Atomic Force Microscopy

2003 ◽  
Vol 107 (36) ◽  
pp. 9677-9680 ◽  
Author(s):  
Chett J. Boxley ◽  
Henry S. White ◽  
Catherine E. Gardner ◽  
Julie V. Macpherson
RSC Advances ◽  
2019 ◽  
Vol 9 (47) ◽  
pp. 27464-27474 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo

Dynamic force microscopy (DFM) has become a multifunctional and powerful technique for the study of the micro–nanoscale imaging and force detection, especially in the compositional and nanomechanical properties of polymers.


2009 ◽  
Vol 1 (2) ◽  
pp. 168-180 ◽  
Author(s):  
David Alsteens ◽  
Etienne Dague ◽  
Claire Verbelen ◽  
Guillaume Andre ◽  
Vincent Dupres ◽  
...  

2015 ◽  
Vol 26 (50) ◽  
pp. 505704 ◽  
Author(s):  
Yan Jun Li ◽  
J Brndiar ◽  
Y Naitoh ◽  
Y Sugawara ◽  
I Štich

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