Principle in Imaging Contrast in Scanning Electron Microscopy for Binary Microstructures Composed of Organosilane Self-Assembled Monolayers

2003 ◽  
Vol 107 (3) ◽  
pp. 664-667 ◽  
Author(s):  
N. Saito ◽  
Y. Wu ◽  
K. Hayashi ◽  
H. Sugimura ◽  
O. Takai
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Scanning Electron

Scanning electron microscopy can form images of patterns in self-assembled monolayers

Langmuir ◽  
1993 ◽  
Vol 9 (6) ◽  
pp. 1513-1516 ◽  
Author(s):  
Gabriel P. Lopez ◽  
Hans A. Biebuyck ◽  
George M. Whitesides
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Scanning Electron

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Chemical modification and patterning of self assembled monolayers using scanning electron and ion-beam lithography

2011 ◽  
Vol 88 (8) ◽  
pp. 1948-1950
Author(s):  
Maria Jesús Pérez Roldán ◽  
César Pascual García ◽  
Gerardo Marchesini ◽  
Douglas Gilliland ◽  
Giacomo Ceccone ◽  
...  
Keyword(s):  
Chemical Modification ◽  
Ion Beam ◽  
Self Assembled Monolayers ◽  
Ion Beam Lithography ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Scanning Electron

Preparation of Au-Ag Nanoframe and its Application in SERS

2015 ◽  
Vol 748 ◽  
pp. 71-75
Author(s):  
Shi Li Liu ◽  
Zhi Qing Xin ◽  
Lu Hai Li
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Silver Nanoplates ◽  
Sers Substrates ◽  
Triangular Silver Nanoplates ◽  
Gold Silver ◽  
Facile Preparation ◽  
Self Assembled ◽  
Scanning Electron

A simple and facile preparation approach of gold-silver nanoframes is described based on triangular silver nanoplates. HAuCl4was used as etching agent and added to boiling nanoplates suspension under stirring. Especially, when different concentrations of HAuCl4was employed, various etching happened and corresponding morphology of gold-silver nanoframes were acquired. The properties of nanoframes were characterized by scanning electron microscopy (SEM) and UV-vis spectra. Then the nanoframes were self-assembled onto the silicon treated with APTMS and used as SERS substrates for detecting p-ATP molecules. The results indicated that nanoframes showed better SERS effects than nanoplates.

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