Vapor pressures of methyl, ethyl, n-propyl, isobutyl, and n-butyl benzoates at reduced pressures

1988 ◽  
Vol 33 (2) ◽  
pp. 75-77 ◽  
Author(s):  
Hirotake Katayama
2021 ◽  
Vol 66 (4) ◽  
pp. 1709-1716
Author(s):  
Greta Bikelytė ◽  
Martin A. C. Härtel ◽  
Marcel Holler ◽  
Andreas Neuer ◽  
Thomas M. Klapötke

1971 ◽  
Vol 93 (4) ◽  
pp. 470-477 ◽  
Author(s):  
F. F. Tao ◽  
J. K. Appledoorn

The effect of liquid properties and the atmospheric environment on cavitation erosion was investigated in a thin film cavitation apparatus which consists of an ultrasonic horn with a flat tip vibrating against a stationary 1/2 in. ball at a frequency of 20 KC. The experimental results show that cavitation erosion is less severe for liquids of higher gas solubility or at vapor pressures greater than 100 torr. It is therefore possible to reduce the damage by blending a light component in lubricants or liquids and/or by environmental control. The effect of ambient pressure was also observed by tests in vacuum and under various reduced pressures up to one atmosphere. The damage increases with the increase of pressure. These results indicate that the most important factor in cavitation erosion is the differential pressure inside and outside the cavities, with the dissolved gases and/or vapor serving to control this pressure differential. The investigation of cavitation erosion with liquids of various properties also provides information for the understanding of the erosion mechanism. Evidence was obtained which supports the theory that the damage is caused by fatigue failure attributable to the impingement of liquid jets during bubble collapse. The liquid properties may control the jets velocity and thus affect the applied stress on surface boundaries.


Author(s):  
Edward D. De-Lamater ◽  
Eric Johnson ◽  
Thad Schoen ◽  
Cecil Whitaker

Monomeric styrenes are demonstrated as excellent embedding media for electron microscopy. Monomeric styrene has extremely low viscosity and low surface tension (less than 1) affording extremely rapid penetration into the specimen. Spurr's Medium based on ERL-4206 (J.Ultra. Research 26, 31-43, 1969) is viscous, requiring gradual infiltration with increasing concentrations. Styrenes are soluble in alcohol and acetone thus fitting well into the usual dehydration procedures. Infiltration with styrene may be done directly following complete dehydration without dilution.Monomeric styrenes are usually inhibited from polymerization by a catechol, in this case, tertiary butyl catechol. Styrene polymerization is activated by Methyl Ethyl Ketone peroxide, a liquid, and probably acts by overcoming the inhibition of the catechol, acting as a source of free radical initiation.Polymerization is carried out either by a temperature of 60°C. or under ultraviolet light with wave lengths of 3400-4000 Engstroms; polymerization stops on removal from the ultraviolet light or heat and is therefore controlled by the length of exposure.


Author(s):  
M. Yamada ◽  
K. Ueda ◽  
K. Kuboki ◽  
H. Matsushima ◽  
S. Joens

Use of variable Pressure SEMs is spreading among electron microscopists The variable Pressure SEM does not necessarily require specimen Preparation such as fixation, dehydration, coating, etc which have been required for conventional scanning electron microscopy. The variable Pressure SEM allows operating Pressure of 1˜270 Pa in specimen chamber It does not allow microscopy of water-containing specimens under a saturated vapor Pressure of water. Therefore, it may cause shrink or deformation of water-containing soft specimens such as plant cells due to evaporation of water. A solution to this Problem is to lower the specimen temperature and maintain saturated vapor Pressures of water at low as shown in Fig. 1 On this technique, there is a Published report of experiment to have sufficient signal to noise ratio for scondary electron imaging at a relatively long working distance using an environmental SEM. We report here a new low temperature microscopy of soft Plant cells using a variable Pressure SEM (Hitachi S-225ON).


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