Revealing Chemical Processes Involved in Electrochemical (De)Lithiation of Al with in Situ Neutron Depth Profiling and X-ray Diffraction

2015 ◽  
Vol 138 (1) ◽  
pp. 231-238 ◽  
Author(s):  
Danny X. Liu ◽  
Anne C. Co
Keyword(s):  
Depth Profiling ◽  
Chemical Processes ◽  
Neutron Depth Profiling ◽  
X Ray Diffraction ◽  
X Ray

Study of Boron Implantation in CdTe

1988 ◽  
Vol 100 ◽  
Author(s):  
D. N. Jamieson ◽  
R. C. Bowman ◽  
P. M. Adams ◽  
J. F. Knudsen ◽  
R. G. Downing
Keyword(s):  
Room Temperature ◽  
Rutherford Backscattering Spectrometry ◽  
Depth Profiling ◽  
Liquid Nitrogen Temperature ◽  
Neutron Depth Profiling ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Boron Implantation ◽  
Induced Structure

ABSTRACTThe effect of large dose boron implantation in single crystal CdTe has been investigated by Rutherford Backscattering Spectrometry with channeling (RBS), double crystal x-ray diffraction (DCD) and photoreflectance spectroscopy (PR). Comparisons are made with the results of identical B implantations of Si and GaAs crystals. Multiple energy implantations were performed at room temperature and liquid nitrogen temperature with total doses up to 1.5×1016 B+ ions/cm2. The implanted B distribution was measured with neutron depth profiling (NDP) and found to agree well with Monte-Carlo ion range calculations. The RBS results showed that the CdTe crystals had not been rendered completely amorphous even for the highest dose implantation, unlike GaAs and Si. Furthermore, the DCD results showed little implantation induced structure in the rocking curves from the implanted CdTe crystals, in contrast to GaAs. The consequences of annealing at 500°C in an attempt to regrow the crystal structure are also discussed.

Amorphous Phase Formation in Solid State Reactions of Layered Nickel Zirconium Films

1984 ◽  
Vol 37 ◽  
Author(s):  
Bruce M. Clemens ◽  
Jeffrey C. Buchholz
Keyword(s):  
Solid State ◽  
Layer Thickness ◽  
Amorphous Phase ◽  
Amorphous Material ◽  
Depth Profiling ◽  
Layer Growth ◽  
Solid State Reactions ◽  
X Ray Diffraction ◽  
X Ray

AbstractFormation of an amorphous zirconium-nickel phase by solid state reaction of a layered crystalline structure has been studied by in-situ resistivity, x-ray diffraction, and Auger depth profiling. The reaction was studied as a function of layer thickness and reaction temperature.Samples with a layer thickness of less than 4 atomic planes had x-ray diffraction spectra with one broad maximum characteristic of amorphous material. As the layer thickness increased, the maximum broadened and separated into two resolved peaks corresponding to crystalline nickel and zirconium. These structures were transformed to an amorphous nickel-zirconium alloy by an anneal at temperatures below the crystallization temperature of the amorphous phase. The reaction occured by a layer growth process, where the thickness of the layer evolved linearly with the square root of time.

Time-resolved in situ powder X-ray diffraction reveals the mechanisms of molten salt synthesis

2016 ◽  
Vol 52 (96) ◽  
pp. 13865-13868 ◽  
Author(s):  
Saul J. Moorhouse ◽  
Yue Wu ◽  
Hannah C. Buckley ◽  
Dermot O'Hare
Keyword(s):  
High Temperature ◽  
Molten Salt ◽  
Powder Diffraction ◽  
High Energy ◽  
Chemical Processes ◽  
Molten Salt Synthesis ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray

We report the first use of high-energy monochromatic in situ X-ray powder diffraction to gain unprecedented insights into the chemical processes occurring during high temperature, lab-scale metal oxide syntheses.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

In-situ Investigation of Bainite Formation with fast X-Ray Diffraction (iXRD)

2017 ◽  
Vol 72 (6) ◽  
pp. 355-364
Author(s):  
A. Kopp ◽  
T. Bernthaler ◽  
D. Schmid ◽  
G. Ketzer-Raichle ◽  
G. Schneider
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

Texture Evolution Under Fast Heating and Cooling Rates of Zirconium Alloys Studied In-Situ by Synchrotron X-Ray Diffraction

2020 ◽  
Author(s):  
Chi-Toan Nguyen ◽  
Alistair Garner ◽  
Javier Romero ◽  
Antoine Ambard ◽  
Michael Preuss ◽  
...  
Keyword(s):  
Texture Evolution ◽  
Zirconium Alloys ◽  
X Ray Diffraction ◽  
Fast Heating ◽  
Cooling Rates ◽  
X Ray ◽  
Heating And Cooling
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