Identify the Activity Origin of Pt Single-Atom Catalyst via Atom-by-Atom Counting

2021 ◽  
Vol 143 (37) ◽  
pp. 15243-15249
Author(s):  
Shuhui Liu ◽  
Hua Xu ◽  
Dongdong Liu ◽  
Hao Yu ◽  
Fan Zhang ◽  
...  
Keyword(s):  
Single Atom ◽  
Atom Counting

scholarly journals Single Atom Counting with Accelerators

1984 ◽  
Vol 15 (2) ◽  
pp. 1-4 ◽  
Author(s):  
W. Wölfli
Keyword(s):  
Single Atom ◽  
Atom Counting

Normalization of the single atom counting rate in an atom trap

2012 ◽  
Vol 38 (1) ◽  
pp. 31 ◽  
Author(s):  
C. F. Cheng ◽  
G. M. Yang ◽  
W. Jiang ◽  
Y. R. Sun ◽  
L. Y. Tu ◽  
...  
Keyword(s):  
Counting Rate ◽  
Single Atom ◽  
Atom Trap ◽  
Atom Counting

scholarly journals Single-atom counting in a two-color magneto-optical trap

2021 ◽  
Vol 103 (3) ◽  
Author(s):  
Martin Schlederer ◽  
Alexandra Mozdzen ◽  
Thomas Lompe ◽  
Henning Moritz
Keyword(s):  
Optical Trap ◽  
Single Atom ◽  
Magneto Optical Trap ◽  
Atom Counting

Single Atom Image Contrast in Fixed Beam Dark Field Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 366-367
Author(s):  
Wah Chi
Keyword(s):  
Scattering Amplitude ◽  
Present Report ◽  
Dark Field ◽  
Image Contrast ◽  
Single Atom ◽  
Optical Theorem ◽  
Hartree Fock ◽  
Heavy Atoms ◽  
Beam Stop ◽  
Fixed Beam

Resolution and contrast are the important factors to determine the feasibility of imaging single heavy atoms on a thin substrate in an electron microscope. The present report compares the atom image characteristics in different modes of fixed beam dark field microscopy including the ideal beam stop (IBS), a wire beam stop (WBS), tilted illumination (Tl) and a displaced aperture (DA). Image contrast between one Hg and a column of linearly aligned carbon atoms (representing the substrate), are also discussed. The assumptions in the present calculations are perfectly coherent illumination, atom object is represented by spherically symmetric potential derived from Relativistic Hartree Fock Slater wave functions, phase grating approximation is used to evaluate the complex scattering amplitude, inelastic scattering is ignored, phase distortion is solely due to defocus and spherical abberation, and total elastic scattering cross section is evaluated by the Optical Theorem. The atom image intensities are presented in a Z-modulation display, and the details of calculation are described elsewhere.

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

Field ion microscope investigations of atomic processes at surfaces

1989 ◽  
Vol 47 ◽  
pp. 228-229
Author(s):  
G. L. Kellogg ◽  
P. R. Schwoebel
Keyword(s):  
Single Crystal ◽  
Crystal Surface ◽  
Linear Chain ◽  
Atom Probe ◽  
Nucleation And Growth ◽  
Single Atom ◽  
Initial Structure ◽  
Atomic Processes ◽  
Single Crystal Surfaces ◽  
Field Ion Microscope

Although no longer unique in its ability to resolve individual single atoms on surfaces, the field ion microscope remains a powerful tool for the quantitative characterization of atomic processes on single-crystal surfaces. Investigations of single-atom surface diffusion, adatom-adatom interactions, surface reconstructions, cluster nucleation and growth, and a variety of surface chemical reactions have provided new insights to the atomic nature of surfaces. Moreover, the ability to determine the chemical identity of selected atoms seen in the field ion microscope image by atom-probe mass spectroscopy has increased or even changed our understanding of solid-state-reaction processes such as ordering, clustering, precipitation and segregation in alloys. This presentation focuses on the operational principles of the field-ion microscope and atom-probe mass spectrometer and some very recent applications of the field ion microscope to the nucleation and growth of metal clusters on metal surfaces.The structure assumed by clusters of atoms on a single-crystal surface yields fundamental information on the adatom-adatom interactions important in crystal growth. It was discovered in previous investigations with the field ion microscope that, contrary to intuition, the initial structure of clusters of Pt, Pd, Ir and Ni atoms on W(110) is a linear chain oriented in the <111> direction of the substrate.

Recent advancement in the electrocatalytic synthesis of ammonia

Nanoscale ◽  
2020 ◽  
Vol 12 (15) ◽  
pp. 8065-8094 ◽  
Author(s):  
Xudong Wen ◽  
Jingqi Guan
Keyword(s):  
Metal Oxide ◽  
Oxide Catalysts ◽  
Single Atom ◽  
Metal Oxide Catalysts ◽  
Metal Free ◽  
Recent Advancement ◽  
Nanocomposite Catalysts

Different kinds of electrocatalysts used in NRR electrocatalysis (including single atom catalysts, metal oxide catalysts, nanocomposite catalysts, and metal free catalysts) are introduced.

Rational prediction of multifunctional bilayer single atom catalysts for the hydrogen evolution, oxygen evolution and oxygen reduction reactions

Nanoscale ◽  
2020 ◽  
Vol 12 (39) ◽  
pp. 20413-20424
Author(s):  
Riming Hu ◽  
Yongcheng Li ◽  
Fuhe Wang ◽  
Jiaxiang Shang
Keyword(s):  
Oxygen Reduction ◽  
Hydrogen Evolution ◽  
Oxygen Evolution ◽  
Single Atom ◽  
Reduction Reactions ◽  
Oxygen Reduction Reactions

Bilayer single atom catalysts can serve as promising multifunctional electrocatalysts for the HER, ORR, and OER.

SINGLE ATOM DETECTABILITY OF A ToF ATOM-PROBE

1984 ◽  
Vol 45 (C9) ◽  
pp. C9-343-C9-347 ◽  
Author(s):  
T. Sakurai ◽  
T. Hashizume ◽  
A. Jimbo
Keyword(s):  
Atom Probe ◽  
Single Atom
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