Time-Resolved Long-Lived Luminescence Imaging Method Employing Luminescent Lanthanide Probes with a New Microscopy System

2007 ◽  
Vol 129 (44) ◽  
pp. 13502-13509 ◽  
Author(s):  
Kenjiro Hanaoka ◽  
Kazuya Kikuchi ◽  
Shigeru Kobayashi ◽  
Tetsuo Nagano
2015 ◽  
Vol 51 (64) ◽  
pp. 12839-12842 ◽  
Author(s):  
Shujuan Liu ◽  
Jie Zhang ◽  
Danfeng Shen ◽  
Hua Liang ◽  
Xiangmei Liu ◽  
...  

A two-channel phosphorescent nanosensor has been designed for use in ratiometric and time-resolved luminescence imaging of intracellular F−.


2019 ◽  
Author(s):  
J. Hrabe ◽  
S. Hrabetova

ABSTRACTAn improved version of Integrative Optical Imaging method has been developed which substantially increases the time resolution of diffusion measurements. We present a theory for Time-Resolved Integrative Optical Imaging (TR-IOI) that incorporates time-dependent effective diffusion coefficient in homogeneous anisotropic media and time-dependent nonspecific linear clearance. The method was applied to measure the very fast changes in extracellular diffusion that occur during spreading depression in rat hippocampal slices. We were able to achieve time resolution of approximately one second, an improvement of at least ten times compared to the standard methods for extracellular diffusion measurement. We have found that diffusion of a small fluorescent extracellular marker (MW 3000) completely stopped during the maximum DC shift associated with the spreading depression wave, then gradually resumed over several minutes afterward. The effect of spreading depression on extracellular space is much larger than previously estimated by other methods with lower time resolution.


Author(s):  
Kazuaki Yazawa ◽  
Dustin Kendig ◽  
Ali Shakouri

Abstract High speed, time-resolved, thermoreflectance imaging is a novel way to locate defects or regions of potential failures in microelectronic devices. This paper reports on our thermoreflectance technique for dynamic imaging of circuit temperature distributions. This transient imaging method is based on a precise electrical lock-in technique with image processing similar to an old fashioned animation movie. An ordinal shutter speed camera is used in conjunction with an illumination LED that is pulsed for sampling the temperature distribution. This paper presents the method and gives a description of the system hardware. A theoretical comparison to lock-in thermography, which is based on infrared emission imaging, will be given. Limitations of thermoreflectance and the driving factors for spatial and time resolution will be discussed. Finally, we highlight and provide examples of near infrared (NIR) wavelength imaging, to enable both through-silicon thermal imaging and emission imaging in the same system. The combination of these two techniques is expected to enable hotspot temperatures and any anomalous emission sites to be correlated, hopefully leading to a better understanding of the nature of the defect.


Author(s):  
Wenpeng Yuan ◽  
Dongyuan Yang ◽  
Baihui Feng ◽  
Yanjun Min ◽  
Zhichao Chen ◽  
...  

The excited-state decay dynamics of 2-ethylpyrrole following UV excitation at a wavelength range of 254.8-218.0 nm is investigated in detail using femtosecond time-resolved photoelectron imaging method. The time-resolved photoelectron spectra...


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