A Synchrotron X-ray Diffraction, Neutron Diffraction, 29Si MAS-NMR, and Computational Study of the Siliceous Form of Zeolite Ferrierite

1994 ◽  
Vol 116 (26) ◽  
pp. 11849-11855 ◽  
Author(s):  
Russell E. Morris ◽  
Scott J. Weigel ◽  
Neil J. Henson ◽  
Lucy M. Bull ◽  
Michael T. Janicke ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Computational Study ◽  
Mas Nmr ◽  
29Si Mas Nmr ◽  
X Ray Diffraction ◽  
X Ray

Structural Study on PbO-SiO2 Glasses by X-Ray and Neutron Diffraction and 29Si MAS NMR Measurements

2005 ◽  
Vol 88 (6) ◽  
pp. 1591-1596 ◽  
Author(s):  
Taigo Takaishi ◽  
Masahide Takahashi ◽  
Jisun Jin ◽  
Takashi Uchino ◽  
Toshinobu Yoko ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Structural Study ◽  
Mas Nmr ◽  
29Si Mas Nmr ◽  
X Ray

Electron and X-Ray Diffraction, and 29Si MAS NMR Studies of the Solid Solution Cs4Sb4O8(Si4(1-)Ge4O12)

1995 ◽  
Vol 114 (2) ◽  
pp. 528-533
Author(s):  
C. Pagnoux ◽  
F. Taulelle ◽  
A. Verbaere ◽  
Y. Piffard ◽  
M. Tournoux
Keyword(s):  
Solid Solution ◽  
Mas Nmr ◽  
29Si Mas Nmr ◽  
X Ray Diffraction ◽  
Nmr Studies ◽  
X Ray

scholarly journals Experimental and computational study of the magnetic properties of ZrMn2−xCoxGe4O12

2017 ◽  
Vol 46 (21) ◽  
pp. 6921-6933 ◽  
Author(s):  
Diming Xu ◽  
Matthew Sale ◽  
Maxim Avdeev ◽  
Chris D. Ling ◽  
Peter D. Battle
Keyword(s):  
Solid Solution ◽  
Magnetic Properties ◽  
Neutron Diffraction ◽  
Computational Study ◽  
X Ray Diffraction ◽  
Ceramic Method ◽  
X Ray

Polycrystalline samples in the solid solution ZrMn2−xCoxGe4O12 (x = 0.0, 0.5, 1.0, 1.5 and 2.0) have been prepared using the ceramic method and characterised by a combination of magnetometry, X-ray diffraction and neutron diffraction.

Phase Transformations in Gel-Derived and Mixed-Powder-Derived Yttrium Disilicate, Y2Si2O7, by X-Ray Diffraction and 29Si MAS NMR

2000 ◽  
Vol 149 (1) ◽  
pp. 16-20 ◽  
Author(s):  
Julien Parmentier ◽  
Philippe R. Bodart ◽  
Ludovic Audoin ◽  
Georges Massouras ◽  
Derek P. Thompson ◽  
...  
Keyword(s):  
Phase Transformations ◽  
Mas Nmr ◽  
29Si Mas Nmr ◽  
X Ray Diffraction ◽  
Mixed Powder ◽  
X Ray ◽  
Yttrium Disilicate

Structural Investigation of Silicalite-I Loaded withn-Hexane by X-ray Diffraction,29Si MAS NMR, and Molecular Modeling

2002 ◽  
Vol 14 (5) ◽  
pp. 2192-2198 ◽  
Author(s):  
Heiko Morell ◽  
Klaus Angermund ◽  
Andrew R. Lewis ◽  
Darren H. Brouwer ◽  
Colin A. Fyfe ◽  
...  
Keyword(s):  
Molecular Modeling ◽  
Structural Investigation ◽  
Mas Nmr ◽  
29Si Mas Nmr ◽  
X Ray Diffraction ◽  
X Ray

Texture measurements in Al2O3 using BEKP

1994 ◽  
Vol 52 ◽  
pp. 608-609
Author(s):  
M. D. Vaudin ◽  
J. P. Cline
Keyword(s):  
Neutron Diffraction ◽  
Rapid Method ◽  
Crystallographic Orientation ◽  
Specimen Surface ◽  
X Ray Diffraction ◽  
Anisotropic Crystal ◽  
X Ray ◽  
Verification Method ◽  
Crystal Properties ◽  
Backscattered Electron

The study of preferred crystallographic orientation (texture) in ceramics is assuming greater importance as their anisotropic crystal properties are being used to advantage in an increasing number of applications. The quantification of texture by a reliable and rapid method is required. Analysis of backscattered electron Kikuchi patterns (BEKPs) can be used to provide the crystallographic orientation of as many grains as time and resources allow. The technique is relatively slow, particularly for noncubic materials, but the data are more accurate than any comparable technique when a sufficient number of grains are analyzed. Thus, BEKP is well-suited as a verification method for data obtained in faster ways, such as x-ray or neutron diffraction. We have compared texture data obtained using BEKP, x-ray diffraction and neutron diffraction. Alumina specimens displaying differing levels of axisymmetric (0001) texture normal to the specimen surface were investigated.BEKP patterns were obtained from about a hundred grains selected at random in each specimen.

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

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