Determination of the chemical state of palladium in PdNa-X zeolite by electron spin resonance and x-ray photoelectron spectroscopy

1985 ◽  
Vol 89 (18) ◽  
pp. 3895-3899 ◽  
Author(s):  
M. Narayana ◽  
J. Michalik ◽  
S. Contarini ◽  
Larry Kevan
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Photoelectron Spectroscopy ◽  
Chemical State ◽  
X Ray ◽  
Spin Resonance ◽  
X Zeolite

X-ray photoelectron spectroscopy and electron spin resonance studies on O2 and N2O plasma oxidation of silicon

1996 ◽  
Vol 39 (3) ◽  
pp. 173-178 ◽  
Author(s):  
Atsushi Masuda ◽  
Yasuto Yonezawa ◽  
Akiharu Morimoto ◽  
Minoru Kumeda ◽  
Tatsuo Shimizu
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Photoelectron Spectroscopy ◽  
Plasma Oxidation ◽  
X Ray ◽  
Spin Resonance

Spectrosopic and paramagnetic properties of molybdenum oxyhydroxide films electrochemically formed from the Keggin-type (PMo12O40)3− complex

2003 ◽  
Vol 18 (10) ◽  
pp. 2509-2514 ◽  
Author(s):  
Masaharu Nakayama ◽  
Takahiro Ii ◽  
Kotaro Ogura
Keyword(s):  
Aqueous Solution ◽  
Fourier Transform ◽  
Electron Spin Resonance ◽  
Electron Spin ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Spin Resonance ◽  
Electrochemically Deposited ◽  
Deposited Film ◽  
Paramagnetic Properties

Molybdenum-containing films electrochemically deposited from an aqueous solution of 12-molybdphosphate (PMo12O40)3− (denoted as PMo12) have been characterized by x-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR), and electron spin resonance (ESR) techniques. XPS and FTIR data indicate that electrolysis of PMo12 leads to the formation of Mo–O–Mo linkage by condensation of the polyanions accompanied by decomposition of the phosphate moiety. The ESR spectrum of the deposited film exhibits an asymmetric signal with g ∼1.92, indicative of pentavalent molybdenum (d1). The feature of this signal is close to that for a MoV ion in the amorphous MoO3 phase, but not in the PMo12 framework. It is therefore suggested that the deposited film no longer has the Keggin structure PMo12, but consists of a continuous structure containing molybdenum oxide.

scholarly journals Origin of Surface Defects in a-Si:H Films

1992 ◽  
Vol 258 ◽  
Author(s):  
H. Yan ◽  
A. Morimoto ◽  
M. Kumeda ◽  
T. Shimizu ◽  
Y. Yonezawa
Keyword(s):  
Electron Spin Resonance ◽  
Electron Spin ◽  
Photoelectron Spectroscopy ◽  
Present Experiment ◽  
Surface Defect ◽  
Surface Defects ◽  
Surface Oxidation ◽  
X Ray ◽  
Spin Resonance ◽  
First Time

ABSTRACTSurface oxidation and surface defect creation processes in a-Si:H films have been studied in detail by means of electron spin resonance(ESR) and X-ray photoelectron spectroscopy(XPS). It is found that Si dangling bonds created by the surface oxidation distribute far wider than the thickness of the SiO2 layer. These defects are also found to be removed out by annealing at around 100°C. These defects are proposed to be created by a stress in a-Si:H induced by the surface oxidation. Moreover, the presence of the surface defects unrelated to oxidation is shown for the first time by the present experiment. The origin of these defects, however, are not clear at present.

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