X-ray photoelectron spectroscopy, X-ray auger electron spectroscopy and electron spin resonance studies of the reduction of some solid metal 12-molybdophosphates

Masamichi Akimoto; Kenji Shima; Etsuro Echigoya

doi:10.1039/f19837902467

X-ray photoelectron spectroscopy, X-ray auger electron spectroscopy and electron spin resonance studies of the reduction of some solid metal 12-molybdophosphates

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19837902467 ◽

1983 ◽

Vol 79 (10) ◽

pp. 2467 ◽

Cited By ~ 8

Author(s):

Masamichi Akimoto ◽

Kenji Shima ◽

Etsuro Echigoya

Keyword(s):

Electron Spin Resonance ◽

Auger Electron Spectroscopy ◽

Electron Spin ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Solid Metal ◽

X Ray ◽

Spin Resonance

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ChemInform Abstract: X-RAY PHOTOELECTRON SPECTROSCOPY, X-RAY AUGER ELECTRON SPECTROSCOPY, AND ELECTRON SPIN RESONANCE STUDIES OF THE REDUCTION OF SOME SOLID METAL 12-MOLYBDOPHOSPHATES

Chemischer Informationsdienst ◽

10.1002/chin.198352033 ◽

1983 ◽

Vol 14 (52) ◽

Author(s):

M. AKIMOTO ◽

K. SHIMA ◽

E. ECHIGOYA

Keyword(s):

Electron Spin Resonance ◽

Auger Electron Spectroscopy ◽

Electron Spin ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Solid Metal ◽

X Ray ◽

Spin Resonance

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Studies on structural properties of amorphous nitrogenated carbon films from electron energy loss, ellipsometry, Auger electron spectroscopy, and electron-spin resonance

Journal of Applied Physics ◽

10.1063/1.369521 ◽

1999 ◽

Vol 85 (4) ◽

pp. 2162-2169 ◽

Cited By ~ 54

Author(s):

S. Bhattacharyya ◽

C. Vallée ◽

C. Cardinaud ◽

O. Chauvet ◽

G. Turban

Keyword(s):

Electron Spin Resonance ◽

Energy Loss ◽

Auger Electron Spectroscopy ◽

Structural Properties ◽

Electron Spin ◽

Electron Spectroscopy ◽

Auger Electron ◽

Carbon Films ◽

Spin Resonance ◽

Electron Energy Loss

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Study of amorphous and crystallised Fe75B25 by Auger electron spectroscopy and X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/0169-4332(91)90396-2 ◽

1991 ◽

Vol 51 (3-4) ◽

pp. 139-155 ◽

Cited By ~ 19

Author(s):

S.K. Sharma ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results

Surface and Interface Analysis ◽

10.1002/sia.2533 ◽

2007 ◽

Vol 39 (5) ◽

pp. 464-466 ◽

Cited By ~ 7

Author(s):

C. J. Powell

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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X-ray photoelectron spectroscopy and electron spin resonance studies on O2 and N2O plasma oxidation of silicon

Materials Science and Engineering B ◽

10.1016/0921-5107(96)01574-7 ◽

1996 ◽

Vol 39 (3) ◽

pp. 173-178 ◽

Cited By ~ 2

Author(s):

Atsushi Masuda ◽

Yasuto Yonezawa ◽

Akiharu Morimoto ◽

Minoru Kumeda ◽

Tatsuo Shimizu

Keyword(s):

Electron Spin Resonance ◽

Electron Spin ◽

Photoelectron Spectroscopy ◽

Plasma Oxidation ◽

X Ray ◽

Spin Resonance

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A correlation of Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and Rutherford backscattering spectrometry measurements on sputter‐deposited titanium nitride thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574092 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2463-2469 ◽

Cited By ~ 104

Author(s):

Brad J. Burrow ◽

Alan E. Morgan ◽

Russell C. Ellwanger

Keyword(s):

Thin Films ◽

Titanium Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

X Ray ◽

Sputter Deposited

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Initial adsorption kinetics of oxygen on a Cu0.82Li0.18 alloy surface studied by combined Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and time‐of‐flight spectrometry of direct recoils

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574817 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1136-1141 ◽

Cited By ~ 4

Author(s):

M. H. Mintz ◽

U. Atzmony ◽

J. A. Schultz ◽

N. Shamir

Keyword(s):

Auger Electron Spectroscopy ◽

Adsorption Kinetics ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Time Of Flight ◽

Alloy Surface ◽

X Ray ◽

Initial Adsorption ◽

Kinetics Of

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