A New Equation of Ion Flux in a Membrane: Inclusion of Frictional Force Generated by the Electric Field

1994 ◽  
Vol 98 (25) ◽  
pp. 6339-6342 ◽  
Author(s):  
Mitsuru Higa ◽  
Akira Kira
Keyword(s):  
Electric Field ◽  
Frictional Force ◽  
Ion Flux ◽  
New Equation

scholarly journals Electronic Controlling on Nanotribological Properties of a Textured Surface by Laser Processing

2017 ◽  
Vol 2017 ◽  
pp. 1-7 ◽  
Author(s):  
Haifeng Yang ◽  
Kun Liu ◽  
Yanqing Wang ◽  
Hao Liu ◽  
Jiaxiang Man ◽  
...  
Keyword(s):  
Electric Field ◽  
External Electric Field ◽  
Bias Voltage ◽  
Frictional Force ◽  
Laser Processing ◽  
Surface Engineering ◽  
Textured Surface ◽  
Friction Forces ◽  
Engineering Research ◽  
Friction Performance

The friction-reducing performance of surfaces with regular nanotextures is a key topic in surface engineering research. This paper presented a simple, easily controlled method for fabricating regular nanotextures on an electrodeposited Ni-Co alloy. The electronic controlling on the friction performance of a nanotexured surface was investigated by AFM. The results showed that the frictional force of a nanotexured surface can be controlled by an external electric field. Before laser processing, the friction initially increased with the bias voltage and then decreased after the bias voltage exceeded 1.0 V. Its friction forces can be changed more than 2 times under the different external electric field. After laser processing, the trend of the frictional force was reversed and its friction forces changed more than 12 times for the laser-processed sample with 0.18 J/cm2 laser power. The results also showed that the friction force decreased when using different nanotextures in an external electric field.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Linear growth of instabilities on a liquid metal under normal electric field

1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid
Keyword(s):  
Liquid Metal ◽  
Electric Field ◽  
Linear Growth ◽  
Normal Electric Field

A Simple Ion Flux Estimation in a Low Pressure R.F. Plasma (13.56 MHz)

1997 ◽  
Vol 7 (4) ◽  
pp. 937-950
Author(s):  
I. Grenier ◽  
V. Massereau ◽  
A. Celerier ◽  
J. Machet
Keyword(s):  
Low Pressure ◽  
Ion Flux ◽  
Flux Estimation
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