Synthesis, Chemical Characterization, and Bonding Analysis of the [Ag{Fe(CO)4}2]3-, [Ag4{.mu.2-Fe(CO)4}4]4-, and [Ag5{.mu.2-Fe(CO)4}2{.mu.3-Fe(CO)4}2]3- Cluster Anions. X-ray Structural Determination of[NMe3CH2Ph]4[Ag4Fe4(CO)16] and [NEt4]3[Ag5Fe4(CO)16]

1994 ◽  
Vol 33 (23) ◽  
pp. 5320-5328 ◽  
Author(s):  
Vincenzo G. Albano ◽  
Fabrizio Azzaroni ◽  
Maria Carmela Iapalucci ◽  
Giuliano Longoni ◽  
Magda Monari ◽  
...  
1995 ◽  
Vol 6 (1) ◽  
pp. 107-123 ◽  
Author(s):  
Vincenzo G. Albano ◽  
Francesca Calderoni ◽  
Maria Carmela Iapalucci ◽  
Giuliano Longoni ◽  
Magda Monari ◽  
...  

1979 ◽  
Vol 57 (23) ◽  
pp. 3171-3172 ◽  
Author(s):  
Josef Bojes ◽  
Tristram Chivers ◽  
Greg MacLean ◽  
Richard T. Oakley ◽  
A. Wallace Cordes

Two novel products, (Ph3P=N)2S4N4 and (Ph3P=N)3S+S4N5−, have been isolated from the reaction of triphenylphosphine with S4N4; an X-ray structural determination of (Ph3P=N)2S4N4 shows it to consist of a 1,5-disubstituted S4N4 ring with the exocyclic substituents in an axial, equatorial configuration.


2019 ◽  
Author(s):  
Christopher Jones ◽  
Matthew Asay ◽  
Lee Joon Kim ◽  
Jack Kleinsasser ◽  
Ambarneil Saha ◽  
...  

Here we apply microcrystal electron diffraction (MicroED) to the structural determination of transition metal complexes. We find that the simultaneous use of 300 keV electrons, very low electron doses, and an ultra-sensitive camera allows for the collection of data without cryogenic cooling of the stage. This technique reveals the first crystal structures of the classic zirconocene hydride, colloquially known as “Schwartz’s reagent”, a novel Pd(II) complex not amenable to solution-state NMR or X-ray crystallography, and five other paramagnetic or diamagnetic transition metal complexes.


1979 ◽  
Vol 20 (22) ◽  
pp. 2063-2066 ◽  
Author(s):  
P. Kok ◽  
P. De Clercq ◽  
M. Vandewale ◽  
J.P. Declercq ◽  
G. Germain ◽  
...  

1994 ◽  
Vol 50 (16) ◽  
pp. 12246-12249 ◽  
Author(s):  
J. C. Woicik ◽  
G. E. Franklin ◽  
Chien Liu ◽  
R. E. Martinez ◽  
I.-S. Hwong ◽  
...  

Author(s):  
Mutharasappan Nachiappan ◽  
Ravi Guru Raj Rao ◽  
Mariadasse Richard ◽  
Dhamodharan Prabhu ◽  
Sundarraj Rajamanikandan ◽  
...  

2020 ◽  
Vol 26 (15) ◽  
pp. 3411-3419 ◽  
Author(s):  
Karl P. J. Gustafson ◽  
Arnar Guðmundsson ◽  
Éva G. Bajnóczi ◽  
Ning Yuan ◽  
Xiaodong Zou ◽  
...  

1970 ◽  
Vol 10 (5) ◽  
pp. 830-831 ◽  
Author(s):  
I. I. Kapshukov ◽  
Yu. F. Volkov ◽  
G. N. Yakovlev

1997 ◽  
Vol 04 (06) ◽  
pp. 1331-1335 ◽  
Author(s):  
C. ROJAS ◽  
J. A. MARTÍn-GAGO ◽  
E. ROMÁN ◽  
G. PAOLUCCI ◽  
B. BRENA ◽  
...  

Deposition of 0.5 Si monolayer (ML) on a Cu (110) surface at room temperature (RT) leads to the formation of a c(2×2) LEED pattern. In order to find out the surface atomic structure of this ordered phase, X-ray photoelectron diffraction (XPD) azimuthal scans at different photon energies and full hemispherical XPD patterns of the Si 2 p core level have been measured using both synchrotron radiation and a laboratory source. We present an atomic model for the surface structure based on the examination of forward scattering and first order interference XPD features. Refinement of the structural parameters was achieved by performing single scattering cluster (SSC) calculations. In the proposed model Si atoms replace Cu atoms at the surface along the [Formula: see text] atomic rows.


Sign in / Sign up

Export Citation Format

Share Document