X-ray structural determination of potassium trinitratouranylate

1970 ◽  
Vol 10 (5) ◽  
pp. 830-831 ◽  
Author(s):  
I. I. Kapshukov ◽  
Yu. F. Volkov ◽  
G. N. Yakovlev
Keyword(s):  
Structural Determination ◽  
X Ray

The formation and structure of a 1,5-disubstituted S4N4 ring, (Ph3P=N)2S4N4, from the reaction of triphenylphosphine with tetrasulphur tetranitride

1979 ◽  
Vol 57 (23) ◽  
pp. 3171-3172 ◽  
Author(s):  
Josef Bojes ◽  
Tristram Chivers ◽  
Greg MacLean ◽  
Richard T. Oakley ◽  
A. Wallace Cordes
Keyword(s):  
Structural Determination ◽  
X Ray ◽  
Novel Products

Two novel products, (Ph3P=N)2S4N4 and (Ph3P=N)3S+S4N5−, have been isolated from the reaction of triphenylphosphine with S4N4; an X-ray structural determination of (Ph3P=N)2S4N4 shows it to consist of a 1,5-disubstituted S4N4 ring with the exocyclic substituents in an axial, equatorial configuration.

scholarly journals Characterization of reactive organometallic species via MicroED

2019 ◽  
Author(s):  
Christopher Jones ◽  
Matthew Asay ◽  
Lee Joon Kim ◽  
Jack Kleinsasser ◽  
Ambarneil Saha ◽  
...  
Keyword(s):  
Transition Metal ◽  
Metal Complexes ◽  
Transition Metal Complexes ◽  
Cryogenic Cooling ◽  
Structural Determination ◽  
X Ray ◽  
X Ray Crystallography ◽  
Diamagnetic Transition

Here we apply microcrystal electron diffraction (MicroED) to the structural determination of transition metal complexes. We find that the simultaneous use of 300 keV electrons, very low electron doses, and an ultra-sensitive camera allows for the collection of data without cryogenic cooling of the stage. This technique reveals the first crystal structures of the classic zirconocene hydride, colloquially known as “Schwartz’s reagent”, a novel Pd(II) complex not amenable to solution-state NMR or X-ray crystallography, and five other paramagnetic or diamagnetic transition metal complexes.

Synthesis, chemical, and electrochemical characterization of the [Ag13{?3-Fe(CO)4}] n? (n = 3, 4, 5) cluster anions: X-Ray structural determination of [N(PPh3)2]3 [Ag12(?12-Ag){?3Fe(CO)4}8]1

1995 ◽  
Vol 6 (1) ◽  
pp. 107-123 ◽  
Author(s):  
Vincenzo G. Albano ◽  
Francesca Calderoni ◽  
Maria Carmela Iapalucci ◽  
Giuliano Longoni ◽  
Magda Monari ◽  
...  
Keyword(s):  
Electrochemical Characterization ◽  
Structural Determination ◽  
Cluster Anions ◽  
X Ray

Pseudoguaianolides: a stereoselective approach to 8(α)-oxygenated helenanolides. X-ray structural determination of a synthetic intermediate.

1979 ◽  
Vol 20 (22) ◽  
pp. 2063-2066 ◽  
Author(s):  
P. Kok ◽  
P. De Clercq ◽  
M. Vandewale ◽  
J.P. Declercq ◽  
G. Germain ◽  
...  
Keyword(s):  
Structural Determination ◽  
X Ray ◽  
Synthetic Intermediate

scholarly journals Structural determination of the Si(111) √3×√3-Bi surface by x-ray standing waves and scanning tunneling microscopy

1994 ◽  
Vol 50 (16) ◽  
pp. 12246-12249 ◽  
Author(s):  
J. C. Woicik ◽  
G. E. Franklin ◽  
Chien Liu ◽  
R. E. Martinez ◽  
I.-S. Hwong ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Standing Waves ◽  
Scanning Tunneling ◽  
Structural Determination ◽  
Tunneling Microscopy ◽  
X Ray

3D Structural Determination of Macromolecules Using X-ray Crystallography Methods

2021 ◽  
pp. 119-140
Author(s):  
Mutharasappan Nachiappan ◽  
Ravi Guru Raj Rao ◽  
Mariadasse Richard ◽  
Dhamodharan Prabhu ◽  
Sundarraj Rajamanikandan ◽  
...  
Keyword(s):  
Structural Determination ◽  
X Ray ◽  
X Ray Crystallography

scholarly journals In Situ Structural Determination of a Homogeneous Ruthenium Racemization Catalyst and Its Activated Intermediates Using X‐Ray Absorption Spectroscopy

2020 ◽  
Vol 26 (15) ◽  
pp. 3411-3419 ◽  
Author(s):  
Karl P. J. Gustafson ◽  
Arnar Guðmundsson ◽  
Éva G. Bajnóczi ◽  
Ning Yuan ◽  
Xiaodong Zou ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Structural Determination ◽  
X Ray ◽  
X Ray Absorption

STRUCTURAL DETERMINATION OF THE Si/Cu(110) INTERFACE BY PHOTOELECTRON DIFFRACTION

1997 ◽  
Vol 04 (06) ◽  
pp. 1331-1335 ◽  
Author(s):  
C. ROJAS ◽  
J. A. MARTÍn-GAGO ◽  
E. ROMÁN ◽  
G. PAOLUCCI ◽  
B. BRENA ◽  
...  
Keyword(s):  
Room Temperature ◽  
Structural Parameters ◽  
Single Scattering ◽  
Structural Determination ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
First Order ◽  
Proposed Model ◽  
Laboratory Source

Deposition of 0.5 Si monolayer (ML) on a Cu (110) surface at room temperature (RT) leads to the formation of a c(2×2) LEED pattern. In order to find out the surface atomic structure of this ordered phase, X-ray photoelectron diffraction (XPD) azimuthal scans at different photon energies and full hemispherical XPD patterns of the Si 2 p core level have been measured using both synchrotron radiation and a laboratory source. We present an atomic model for the surface structure based on the examination of forward scattering and first order interference XPD features. Refinement of the structural parameters was achieved by performing single scattering cluster (SSC) calculations. In the proposed model Si atoms replace Cu atoms at the surface along the [Formula: see text] atomic rows.

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