The Fine Structure of Matter. Part I. X-Rays and the Structure of Matter (Clark, C. H. Douglas)

1938 ◽  
Vol 15 (3) ◽  
pp. 150
Author(s):  
W. H. Zachariasen
Keyword(s):  
Fine Structure ◽  
X Rays ◽  
Structure Of Matter

Diffraction

2012 ◽  
Vol 20 (2) ◽  
pp. 7-7
Author(s):  
Charles Lyman
Keyword(s):  
Electron Diffraction ◽  
100Th Anniversary ◽  
Primary Phase ◽  
Phase Identification ◽  
X Rays ◽  
X Ray Diffraction ◽  
Identification Methods ◽  
X Ray ◽  
Structure Of Matter

This year marks the 100th anniversary of the discovery of X-ray diffraction and the 85th anniversary of electron diffraction (see Microscopy Pioneers). For most of the time since their introduction, microscopists have known these two techniques as the primary phase identification methods used in conjunction with various microscopies. However, these two diffraction methods also have played enormous roles in understanding the structure of matter, as well as the nature of both X rays and electrons.

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Si Wafer

X-Ray Absorption Fine Structure with Polarized X-Rays

1953 ◽  
Vol 92 (6) ◽  
pp. 1394-1396 ◽  
Author(s):  
R. Krogstad ◽  
W. Nelson ◽  
S. T. Stephenson
Keyword(s):  
Fine Structure ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Resonant Raman Scattering of synchrotron X-rays by neodymium: Observation of fine structure in K-L-RRS and of K-N-RRS

1984 ◽  
Vol 319 (1) ◽  
pp. 1-7 ◽  
Author(s):  
D. Schaupp ◽  
H. Czerwinski ◽  
F. Smend ◽  
R. Wenskus ◽  
M. Schumacher ◽  
...  
Keyword(s):  
Fine Structure ◽  
Raman Scattering ◽  
X Rays ◽  
Resonant Raman ◽  
Resonant Raman Scattering
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