X-Ray Absorption Fine Structure with Polarized X-Rays

1953 ◽  
Vol 92 (6) ◽  
pp. 1394-1396 ◽  
Author(s):  
R. Krogstad ◽  
W. Nelson ◽  
S. T. Stephenson
Keyword(s):  
Fine Structure ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Si Wafer

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies

2020 ◽  
Vol 27 (6) ◽  
pp. 1618-1625
Author(s):  
Yuki Wakisaka ◽  
Bing Hu ◽  
Daiki Kido ◽  
Md. Harun Al Rashid ◽  
Wenhan Chen ◽  
...  
Keyword(s):  
Fine Structure ◽  
Sudden Change ◽  
Fluorescence Emission ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Bent Crystal ◽  
Absorption Fine ◽  
X Ray Absorption

A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF-XAFS), which has a long X-ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X-ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film with high sensitivity was obtained. Although range-extended XAFS was expected by the rejection of Au fluorescence arising from the Au substrate, a small glitch was found in the Au L 3 edge because of the sudden change of the complex refraction index of the Au substrate at the Au edge. This abnormal spectrum feature can be removed by reflectivity correction using Au foil absorption data. BCLA combined with TRF-XAFS spectroscopy (BCLA + TRF-XAFS) is a new technique for the in situ surface analysis of highly dispersed systems even in the presence of a liquid overlayer.

Laser-EXAFS: Fast Extended X-ray Absorption Fine Structure Spectroscopy with a Single Pulse of Laser-Produced X-rays

Science ◽  
1979 ◽  
Vol 206 (4416) ◽  
pp. 353-355 ◽  
Author(s):  
P. J. MALLOZZI ◽  
R. E. SCHWERZEL ◽  
H. M. EPSTEIN ◽  
B. E. CAMPBELL
Keyword(s):  
Fine Structure ◽  
Single Pulse ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Laser-Produced Plasmas as an Alternative X-Ray Source for Synchrotron Radiation Research and for Microradiography

1978 ◽  
Vol 22 ◽  
pp. 267-279
Author(s):  
P. J. Mallozzi ◽  
H. M. Epstein ◽  
R. E. Schwerzel
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
Special Interest ◽  
Pulsed Laser ◽  
Solid Target ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Radiation Research

The radiation from plasmas produced by the interaction of a pulsed laser and a solid target can be made to fall in the soft x-ray regime. The x-rays can serve as an alternative to the increasingly important synchrotron radiation facilities for a variety of techniques such as Extended X-ray Absorption Fine-Structure Spectroscopy and X-ray Lithography. In addition, the x-rays are of special interest for general microradiography of thin samples.

scholarly journals Surface Sensitive X-ray Absorption Fine Structure Measurement Using Sample Current Induced by Totally Reflected X-rays.

1993 ◽  
Vol 69 (7) ◽  
pp. 179-184 ◽  
Author(s):  
Jun KAWAI ◽  
Shinjiro HAYAKAWA ◽  
Yoshinori KITAJIMA ◽  
Setsuo SUZUKI ◽  
Kuniko MAEDA ◽  
...  
Keyword(s):  
Fine Structure ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Structure Measurement

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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