Optoelectric Charge Trapping/Detrapping in Thin Solid Films of Organic Azo Dyes:  Application of Scanning Tunneling Microscopic Tip Contact to Photoconductive Films for Data Storage

1998 ◽  
Vol 10 (3) ◽  
pp. 840-846 ◽  
Author(s):  
Chong-yang Liu ◽  
Allen J. Bard
Keyword(s):  
Data Storage ◽  
Azo Dyes ◽  
Charge Trapping ◽  
Scanning Tunneling ◽  
Thin Solid Films ◽  
Solid Films

Electrochoromic Display Using V2O5 Amorphous Thin Solid Films

1988 ◽  
Vol 17 (3) ◽  
pp. 76-78
Author(s):  
Ramakuru N. Prasad ◽  
Abayankar Neelima ◽  
R. N. Karekar
Keyword(s):  
Thin Solid Films ◽  
Solid Films

scholarly journals Corrigendum to Procedure to convert optical-constant models into analytic Thin Solid Films (2018) 52-59

2021 ◽  
Vol 733 ◽  
pp. 138816
Author(s):  
Juan I. Larruquert ◽  
Luis V. Rodríguez-de Marcos
Keyword(s):  
Optical Constant ◽  
Thin Solid Films ◽  
Solid Films

Sensitivity Enhancement of Surface Plasmon Resonance Sensor with Two Dimensional Materials Covered on Silver-Nickel Bimetallic Thin Solid Films

2020 ◽  
Vol 18 (10) ◽  
pp. 776-779
Author(s):  
L. Castañeda
Keyword(s):  
2D Materials ◽  
Sensitivity Enhancement ◽  
Thin Solid Films ◽  
Solid Films ◽  
Kretschmann Configuration ◽  
Enhanced Sensitivity ◽  
Resonance Sensor ◽  
Two Dimensional Materials ◽  
Fresnel Equation ◽  
Hybrid Configuration

In this paper a new sensing configuration with enhanced sensitivity utilizing 2D materials on the bimetallic layers of Magnetic Material Ni over Ag for Kretschmann configuration is proposed and analyzed numerically using Fresnel equation and transfer matrix method. Results show that such a hybrid configuration with well optimized thickness of metallic layer and utilization of specific no. of 2D materials can increases the sensitivity as high as 298°/RIU is absorbed for the configuration consist 10 nm of Ni over 40 nm thickness of Ag added with a 2 layers of WSe2.

High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films

2006 ◽  
Vol 252 (15) ◽  
pp. 5602-5606 ◽  
Author(s):  
J.J. Kim ◽  
E. Ikenaga ◽  
M. Kobata ◽  
A. Takeuchi ◽  
M. Awaji ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Thin Solid Films ◽  
X Ray ◽  
Solid Films ◽  
Essential Tool
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