Focused-ion-beam Assisted Growth, Patterning, and Narrowing the Size Distributions of ZnO Nanowires for Variable Optical Properties and Enhanced Nonmechanical Energy Conversion

2013 ◽  
Vol 25 (14) ◽  
pp. 2819-2827 ◽  
Author(s):  
Xianying Wang ◽  
Shufang Xie ◽  
Jian Liu ◽  
Sergei O. Kucheyev ◽  
Y. Morris Wang
Keyword(s):  
Optical Properties ◽  
Energy Conversion ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Zno Nanowires ◽  
Size Distributions

Modification of structure and optical property of ZnO nanowires by Ga ion beam

2009 ◽  
Vol 1201 ◽  
Author(s):  
Yao Cheng ◽  
Yao Liang ◽  
Ming Lei ◽  
Siu Kong Hark ◽  
Ning Wang
Keyword(s):  
Optical Property ◽  
Low Temperatures ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Green Emission ◽  
Zno Nanowires ◽  
Crystal Quality ◽  
Spectroscopy Study ◽  
Doped Zno ◽  
Ga Doping

AbstractBased on the focused ion beam (FIB) technology, we have prepared ZnO nanowires containing periodic nano-sized structures by an ultra thin Ga ion beam. ZnO nanowires can keep a good crystal quality after Ga ion bombardment. The cathodoluminescence (CL) spectroscopy study of the Ga-doped ZnO nanowires at low temperatures shows that the Ga doping effect can largely suppress the green emission that may mainly originate from the defects on the surfaces of ZnO nanowires.

Examining the crystal growth that influences the electronic device output from vertical arrays of ZnO nanowires

2014 ◽  
Vol 1659 ◽  
pp. 101-106
Author(s):  
Alex M. Lord ◽  
Michael B. Ward ◽  
Alex S. Walton ◽  
Jonathan Evans ◽  
Nathan Smith ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Focused Ion Beam ◽  
Electronic Device ◽  
Ion Beam ◽  
Electrical Contact ◽  
Zno Nanowires ◽  
Base Layer ◽  
Vertical Arrays ◽  
Growth Method ◽  
A Minor

ABSTRACTZnO nanowire (NW) arrays were examined with Transmission Electron Microscopy (TEM) in cross-section after preparation by Focused Ion Beam (FIB) milling. This technique revealed that ZnO nanowires grown using a Au catalyzed vapor technique typically have Au particles at the NW tips, and also randomly dispersed across the base crystal growth that joins adjacent NWs. It is shown the adjacent NWs and the combined base growth is one crystal structure which can be used as a back electrical contact making fabrication of vertical array devices possible. However, the base growth displays detrimental features such as embedded Au particles and lattice defects which can affect the electrical output through depletion regions and scattering centers. In an effort to overcome these problems we investigate a growth method that is nucleated through a minor alteration of the a-plane sapphire surface roughness via a weak chemical etch. Observations of various stages of the growth show the growth nucleates as separate nanoislands that grow in c-plane alignment with Sapphire (1-210), and as growth continues these islands meet and form a polycrystalline film. Further growth initiates nanowire growth and the formation of a single crystal base layer and NW structure that can cover several square millimeter’s. This allows high quality arrays that are relatively free from defects to be formed without any metals contamination and ready for further device processing.

scholarly journals Optical Properties and Immunoassay Applications of Noble Metal Nanoparticles

2010 ◽  
Vol 2010 ◽  
pp. 1-12 ◽  
Author(s):  
Shaoli Zhu ◽  
Wei Zhou
Keyword(s):  
Optical Properties ◽  
Metal Nanoparticles ◽  
Noble Metal ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Fdtd Method ◽  
Dipole Approximation ◽  
Noble Metal Nanoparticles ◽  
Nanostructure Fabrication ◽  
Potential Applications

Noble metal, especially gold (Au) and silver (Ag) nanoparticles exhibit unique and tunable optical properties on account of their surface plasmon resonance (SPR). In this paper, we mainly discussed the theory background of the enhanced optical properties of noble metal nanoparticles. Mie theory, transfer matrix method, discrete dipole approximation (DDA) method, and finite-difference time domain (FDTD) method applied brute-force computational methods for different nanoparticles optical properties. Some important nanostructure fabrication technologies such as nanosphere lithography (NSL) and focused ion beam (FIB) are also introduced in this paper. Moreover, these fabricated nanostructures are used in the plasmonic sensing fields. The binding signal between the antibody and antigen, amyloid-derived diffusible ligands (ADDLs)-potential Alzheimer's disease (AD) biomarkers, and staphylococcal enterotixn B (SEB) in nano-Moore per liter (nM) concentration level are detected by our designed nanobiosensor. They have many potential applications in the biosensor, environment protection, food security, and medicine safety for health, and so forth, fields.

Study of the Influence of Structural Defects on Properties of Silicon Solar Cells

2013 ◽  
Vol 592-593 ◽  
pp. 449-452
Author(s):  
Jiří Šicner ◽  
Pavel Škarvada ◽  
Robert Macků ◽  
Pavel Koktavý
Keyword(s):  
Optical Properties ◽  
Solar Cells ◽  
Electron Microscope ◽  
Solar Cell ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ccd Camera ◽  
Structural Defects ◽  
Silicon Solar Cells

Solar cells of common sizes contains many of these defects and it is not easy to determine the influence of particular defects on the characteristics of the whole solar cell. Therefore, in our research we use samples of size of square centimeter at which we can disentangle the influence of the defect. We localize the defect by using a CCD camera, we measure the electrical, thermal and optical properties of the sample and then study it by means an electron microscope, we find the damaged structure and put it to focused ion beam. We expect the change in electrical, thermal and optical properties of the sample.

Optical properties of a low energy focused ion beam apparatus for direct deposition

1997 ◽  
Vol 68 (6) ◽  
pp. 2331-2338
Author(s):  
Shinji Nagamachi ◽  
Masahiro Ueda ◽  
Yasuhiro Yamakage ◽  
Hiromasa Maruno ◽  
Junzo Ishikawa
Keyword(s):  
Optical Properties ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Low Energy ◽  
Direct Deposition

scholarly journals Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires

2019 ◽  
Vol 16 (33) ◽  
pp. 13-20 ◽  
Author(s):  
Jr-Hau He ◽  
Pei H. Chang ◽  
Cheng-Ying Chen ◽  
Kun-Tonh Tsai
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Zno Nanowires

scholarly journals Nanostructured Arrays Formed by Finely Focused Ion Beams

1998 ◽  
Vol 536 ◽  
Author(s):  
R. A. Zuhr ◽  
J. D. Budai ◽  
P. G. Datskos ◽  
A. Meldrum ◽  
K. A. Thomas ◽  
...  
Keyword(s):  
Optical Properties ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Rectangular Lattice ◽  
Uniform Size ◽  
Force Microscopy ◽  
Size Dependent ◽  
Atomic Force ◽  
Transmission Electron ◽  
Initial Work

AbstractAmorphous, polycrystalline, and single crystal nanometer dimension particles can be formed in a variety of substrates by ion implantation and subsequent annealing. Such composite colloidal materials exhibit unique optical properties that could be useful in optical devices, switches, and waveguides. However colloids formed by blanket implantation are not uniform in size due to the nonuniform density of the implant, resulting in diminution of the size dependent optical properties. The object of the present work is to form more uniform size particles arranged in a 2-dimensional lattice by using a finely focused ion beam to implant identical ion doses only into nanometer size regions located at each point of a rectangular lattice. Initial work is being done with a 30 keV Ga beam implanted into Si. Results of particle formation as a function of implant conditions as analyzed by Rutherford backscattering, x-ray analysis, atomic force microscopy, and both scanning and transmission electron microscopy will be presented and discussed.

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