Determination of Young’s Modulus for Nanofibrillated Cellulose Multilayer Thin Films Using Buckling Mechanics

2011 ◽  
Vol 12 (4) ◽  
pp. 961-969 ◽  
Author(s):  
Emily D. Cranston ◽  
Mohamed Eita ◽  
Erik Johansson ◽  
Julia Netrval ◽  
Michaela Salajková ◽  
...  
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Nanofibrillated Cellulose ◽  
Multilayer Thin Films

On the determination of Young’s modulus of thin films with impulse excitation technique

2016 ◽  
Vol 32 (3) ◽  
pp. 497-511 ◽  
Author(s):  
M.F. Slim ◽  
A. Alhussein ◽  
A. Billard ◽  
F. Sanchette ◽  
M. François
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Impulse Excitation ◽  
Image Position

Abstract

Determination of young's modulus by a resonant technique applied to two dynamically ion mixed thin films

1997 ◽  
Vol 292 (1-2) ◽  
pp. 55-60 ◽  
Author(s):  
S. Peraud ◽  
S. Pautrot ◽  
P. Villechaise ◽  
P. Mazot ◽  
J. Mendez
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus

scholarly journals On the determination of the Young’s modulus of thin films using indentation tests

2007 ◽  
Vol 44 (25-26) ◽  
pp. 8313-8334 ◽  
Author(s):  
J.M. Antunes ◽  
J.V. Fernandes ◽  
N.A. Sakharova ◽  
M.C. Oliveira ◽  
L.F. Menezes
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Indentation Tests

Advances in metrology for the determination of Young's modulus for low-k dielectric thin films

2012 ◽  
Author(s):  
Sean King ◽  
George A. Antonelli ◽  
Gheorghe Stan ◽  
Robert F. Cook ◽  
R. Sooryakumar
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Dielectric Thin Films ◽  
Low K

Indentation at the Nanometer Scale on Ultra Thin Films of Diamond-Like Carbon

1994 ◽  
Vol 356 ◽  
Author(s):  
Sandrine Bec ◽  
André Tonck ◽  
Jean-Luc Loubet
Keyword(s):  
Thin Films ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Elastic Recovery ◽  
Contact Stiffness ◽  
Natural Diamond ◽  
Tangential Displacement ◽  
Diamond Like Carbon ◽  
New Instrument

AbstractUltra thin films (50 nm and 180 nm) of amorphous diamond-like carbon on a silicon substrate produced by laser ablation are tested by nanoindentation with a new instrument deriving from a Surface Force Apparatus. Quasi-static measurements of the load and dynamic measurements of the contact stiffness are continuously and simultaneously recorded versus the penetration depth. Scanning lines on the tested surface before and after indentation are made by means of tangential displacement of the diamond indenter on the surface.The tests are conducted with maximum loads from 50 μN to 2500 μN, which correspond to maximum indentation depths between 7 nm and 70 nm. The indentation curves show near elastic recovery but scanning lines and/or topographic images on the surfaces show detectable plastic prints. Despite the extremely small residual indentation depths for these ultra thin films, we show how the hardness value we calculate from the indentation curves with an elastoplastic theory is in good agreement with the hardness value we calculate from the indentation print profile. The determination of the Young's modulus, even at the smallest indentation depths, must take into account the mechanical properties of the substrate. The determination of both values, hardness and elastic modulus, also requires a calibration procedure for the geometry of the tip and knowledge of the piling-up effect.We find that the apparent hardness and the apparent Young's modulus of the tested diamondlike films are high. They are underestimated in comparison with the real values. A rough correction which overestimates the Young’s modulus gives higher values than those of natural diamond.

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