scholarly journals Substrate properties of 25-nt parallel-stranded linear DNA duplexes

Biochemistry ◽  
1989 ◽  
Vol 28 (24) ◽  
pp. 9542-9549 ◽  
Author(s):  
Karsten Rippe ◽  
Thomas M. Jovin
Keyword(s):  
Dna Duplexes ◽  
Linear Dna ◽  
Substrate Properties

Targeting in linear DNA duplexes with two complementary probe strands for hybrid stability

1993 ◽  
Vol 3 (4) ◽  
pp. 365-372 ◽  
Author(s):  
Elissa P. Sena ◽  
David A. Zarling
Keyword(s):  
Dna Duplexes ◽  
Linear Dna

Thermodynamics of dT−dT Base Pair Mismatching in Linear DNA Duplexes and Three-Arm DNA Junctions†

Biochemistry ◽  
1997 ◽  
Vol 36 (9) ◽  
pp. 2485-2491 ◽  
Author(s):  
Min Zhong ◽  
Luis A. Marky ◽  
Neville R. Kallenbach ◽  
Donald W. Kupke
Keyword(s):  
Base Pair ◽  
Dna Duplexes ◽  
Linear Dna ◽  
Dna Junctions

scholarly journals Spectroscopic properties and helical stabilities of 25-nt parallel-stranded linear DNA duplexes

Biochemistry ◽  
1989 ◽  
Vol 28 (24) ◽  
pp. 9536-9541 ◽  
Author(s):  
Karsten Rippe ◽  
Niels B. Ramsing ◽  
Thomas M. Jovin
Keyword(s):  
Spectroscopic Properties ◽  
Dna Duplexes ◽  
Linear Dna

New nucleoside triphosphates modified at 5'-position, synthesis and substrate properties towards DNA polymerases

1993 ◽  
Vol 58 (s1) ◽  
pp. 120-121
Author(s):  
E. Shirokova ◽  
A. Shipitsin ◽  
E. Kusnetsova ◽  
L. Victorova ◽  
A. Krayevsky
Keyword(s):  
Dna Polymerases ◽  
Nucleoside Triphosphates ◽  
Substrate Properties ◽  
Position Synthesis

Quantitative Measurement of Fluorescent Layers with Respect to Spatial Thickness Variations and Substrate Properties

2020 ◽  
Vol 74 (4) ◽  
pp. 439-451
Author(s):  
Philipp Holz ◽  
Christoph Pönisch ◽  
Albrecht Brandenburg
Keyword(s):  
Manufacturing Industry ◽  
Quantitative Measurement ◽  
Fluorescence Emission ◽  
Fluorescence Analysis ◽  
Thin Layers ◽  
Fluorescence Signal ◽  
Functional Coatings ◽  
Custom Made ◽  
Substrate Properties ◽  
Thickness Variations

Imaging fluorescence spectroscopy proves to be a fast and sensitive method for measuring the thickness of thin coatings in the manufacturing industry. This encouraged us to systematically study, theoretically and experimentally, parameters that influence the fluorescence of thin layers. We analyzed the fluorescence signal as a function of the scattering and reflectance properties of the sample substrate. In addition, we investigated effects of the layer properties on fluorescence emission. A ray-tracing software is used to describe the influence of these parameters on the fluorescence emission of thin layers. Experiments using a custom-made system for imaging fluorescence analysis verify the simulations. This work shows a factor five variation of fluorescence intensity as a function of the reflectance of the sample substrate. Simulations show variations by a factor of up to eight for samples with different surface roughness. Results on tilted samples indicate a significant increase of the detected fluorescence signal, for fluorescent droplets on reflective substrates, if illuminated and coaxially observed at angles greater than 25°. These findings are of utmost relevance for all applications which utilize the fluorescence emission to quantify thin layers. These applications range from in-line lubricant monitoring in press plants to monitoring of functional coatings in medical technology and the detection of filmic contaminations.

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