Sol−Gel-Derived Iron Oxide Thin Films on Silicon: Surface Properties and Interfacial Chemistry

2009 ◽  
Vol 1 (9) ◽  
pp. 1843-1846 ◽  
Author(s):  
Chi-dong Park ◽  
Jeremy Walker ◽  
Rina Tannenbaum ◽  
A. E. Stiegman ◽  
J. Frydrych ◽  
...  
Keyword(s):  
Thin Films ◽  
Iron Oxide ◽  
Surface Properties ◽  
Silicon Surface ◽  
Sol Gel ◽  
Oxide Thin Films ◽  
Interfacial Chemistry

Iron-Oxide and Yttrium-Iron-Oxide Thin Films a Test of the Feasibility of Producing and Measuring Micro- and Millimeter-Wave Materials

1986 ◽  
Vol 73 ◽  
Author(s):  
Ralph W. Bruce ◽  
George Kordas
Keyword(s):  
Thin Films ◽  
Iron Oxide ◽  
Tin Oxide ◽  
Sol Gel ◽  
Oxide Thin Films ◽  
Yttrium Iron ◽  
Absorption Bands ◽  
Coated Substrate ◽  
Millimeter Wave Materials ◽  
Yttrium Iron Oxide

ABSTRACTTin-oxide/iron-oxide and yttrium-iron-oxide thin-films have been produced with the sol-gel method. Film thicknesses from 50 to 155 nm were deposited by the sol-to-gel transformation onto borosilicate substrates. The dielectric losses of the films were deduced by the complex reflection coefficient of these materials in the range from 2 GHz to 18GHz using an HP network analyzer.Samples of 5 cm × 5 cm were centered on the waveguide flange and a shorting plate (12.2 cm × 15.2 cm) of brass centered over the sample. Measurements were automatically made using the HP software provided.In the X-Band region, three absorption bands at 8.3, 9.4, and 11.5 GHz were detected for the substrate, with losses (absorption peaks) ranging from 13.5, 11.9, and 9.9, respectively. For the tin-oxide/iron-oxide sol-gel coated substrate, three bands at 8.4, 9.5, and 11.6 GHz were observed having losses of 16.2 to 13.4, 12.9 to 11.4. and 11.3 to 9.7, respectively, depending upon thickness and orientation. For the yttrium-iron-oxide sol-gel coated substrate, three bands at 8.4, 9.5, and 11.6, with losses depending upon solgel thickness and orientation.

Effect of Spinrate on the Structural, Optical and Surface Properties of the Sol-Gel Spin Coated Zinc Oxide Thin Films

2013 ◽  
Vol 699 ◽  
pp. 403-408
Author(s):  
M. Senthamizh Selvi ◽  
N. Sankara Subramanian ◽  
S. Rajathi
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Surface Properties ◽  
Texture Coefficient ◽  
Hexagonal Phase ◽  
Sol Gel ◽  
Average Crystallite Size ◽  
Band Gap Energy ◽  
Zno Films ◽  
Oxide Thin Films

Zinc Oxide thin films have been deposited on glass substrates at different spin rate by sol-gel spin coating method. XRD measurement of the ZnO films confirms the Wurtzite hexagonal phase with the preferred orientation along the C-axis (002) plane. The other characteristic orientations (100) and (101) have also been observed. The average crystallite size evaluated from the XRD data lies between 5 nm and 20 nm. The crystallographic parameters viz., lattice constants, mean crystalline size, dislocation density, texture coefficient and standard deviation have been calculated from the XRD data. The estimated texture coefficient indicates the oriented overgrowth of (002) plane for the ZnO films spin coated up to the spin rate 3500 rpm. ZnO thinfilm spin coated at 4000 rpm and 3500 rpm shows maximum transmittance of 87.5% and 88.5 % respectively at 850 nm. The measured direct band gap energy of the ZnO films coated at different spin rates varies between 3 eV and 3.3 eV. The grain size observed from the microstructure of AFM is around 50 nm and this indicates the aggregation of nanosize cryatallites. The effect of spin rate on the structural, optical and surface properties of the spin coated ZnO thinfilms have been investigated and reported.

Characterization of Iron Oxide Thin Films Prepared by Sol–Gel Processing

2008 ◽  
Vol 8 (2) ◽  
pp. 901-906 ◽  
Author(s):  
Aylin Karakuscu ◽  
Macit Ozenbas
Keyword(s):  
Thin Films ◽  
Iron Oxide ◽  
Electron Diffraction ◽  
Film Thickness ◽  
Annealing Time ◽  
Annealing Temperature ◽  
Structural Characteristics ◽  
Sol Gel ◽  
Single Layer ◽  
Oxide Thin Films

Iron oxide thin films were prepared by spin-coating a gel solution of iron(III) nitrate dissolved in 2-methoxyethanol and acetylacetone on glass and quartz substrates. The film thickness was adjusted by changing the spinning rate of the spin coater. Annealing was carried out between 300 °C to 600 °C to investigate the phases present in the films. Viscosity of the main solution was found as 0.0035 Pa·s by viscosity measurement. TGA/DTA analyses showed that heat treatment should be done between 330 &degC and 440 °C in order to produce maghemite thin films. SEM studies showed that single layer thickness of the films were between 65 and 80 nm. The structural characteristics were evaluated by changing the experimental parameters which are annealing temperature, annealing time and thickness of the films. From the X-ray diffraction analysis, maghemite formation was observed with decreasing annealing temperature, annealing time and film thickness. TEM results verified the presence of the maghemite phase by electron diffraction and selected area electron diffraction (SAED) methods. According to UV-Vis results transmittance of the films decreases with increasing annealing temperature.

Study on Preparation of Nano-Sized Iron Oxide Thin Films and its Modification

2013 ◽  
Vol 750-752 ◽  
pp. 1945-1948
Author(s):  
Yan Zhu ◽  
Jing Wang
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Iron Oxide ◽  
Ferric Oxide ◽  
Convex Surface ◽  
Sol Gel ◽  
Dip Coating ◽  
Bismuth Nitrate ◽  
Oxide Thin Film ◽  
Oxide Thin Films

Nano iron oxide thin films were prepared by both citric acid sol-gel and dip-coating method. The modifications of nano ferric oxide thin film materials were carried out by using PEG and bismuth nitrate . Both nano ferric oxide thin film materials prepared and the modified were characterized by SEM, XRD. It is indicated that that modification of wether PEG or bismuth nitrate to the thin film can reduce the convex surface and the thin film surfaces are more uniform.

High Li+-Ion Storage Capacity and Double-Electrochromic Behavior of Sol−Gel-Derived Iron Oxide Thin Films with Sulfate Residues

2001 ◽  
Vol 13 (6) ◽  
pp. 1976-1983 ◽  
Author(s):  
Zhongchun Wang ◽  
Xingfang Hu ◽  
Per-Olov Käll ◽  
Ulf Helmersson
Keyword(s):  
Thin Films ◽  
Iron Oxide ◽  
Storage Capacity ◽  
Sol Gel ◽  
Oxide Thin Films ◽  
Ion Storage ◽  
Li Ion
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