Characterization of Iron Oxide Thin Films Prepared by Sol–Gel Processing

2008 ◽  
Vol 8 (2) ◽  
pp. 901-906 ◽  
Author(s):  
Aylin Karakuscu ◽  
Macit Ozenbas

Iron oxide thin films were prepared by spin-coating a gel solution of iron(III) nitrate dissolved in 2-methoxyethanol and acetylacetone on glass and quartz substrates. The film thickness was adjusted by changing the spinning rate of the spin coater. Annealing was carried out between 300 °C to 600 °C to investigate the phases present in the films. Viscosity of the main solution was found as 0.0035 Pa·s by viscosity measurement. TGA/DTA analyses showed that heat treatment should be done between 330 &degC and 440 °C in order to produce maghemite thin films. SEM studies showed that single layer thickness of the films were between 65 and 80 nm. The structural characteristics were evaluated by changing the experimental parameters which are annealing temperature, annealing time and thickness of the films. From the X-ray diffraction analysis, maghemite formation was observed with decreasing annealing temperature, annealing time and film thickness. TEM results verified the presence of the maghemite phase by electron diffraction and selected area electron diffraction (SAED) methods. According to UV-Vis results transmittance of the films decreases with increasing annealing temperature.

2005 ◽  
Vol 493 (1-2) ◽  
pp. 83-87 ◽  
Author(s):  
J. Santos-Cruz ◽  
G. Torres-Delgado ◽  
R. Castanedo-Perez ◽  
S. Jiménez-Sandoval ◽  
O. Jiménez-Sandoval ◽  
...  

2008 ◽  
Vol 517 (2) ◽  
pp. 681-685 ◽  
Author(s):  
M.A. Flores-Mendoza ◽  
R. Castanedo-Perez ◽  
G. Torres-Delgado ◽  
J. Márquez Marín ◽  
O. Zelaya-Angel

1986 ◽  
Vol 73 ◽  
Author(s):  
Ralph W. Bruce ◽  
George Kordas

ABSTRACTTin-oxide/iron-oxide and yttrium-iron-oxide thin-films have been produced with the sol-gel method. Film thicknesses from 50 to 155 nm were deposited by the sol-to-gel transformation onto borosilicate substrates. The dielectric losses of the films were deduced by the complex reflection coefficient of these materials in the range from 2 GHz to 18GHz using an HP network analyzer.Samples of 5 cm × 5 cm were centered on the waveguide flange and a shorting plate (12.2 cm × 15.2 cm) of brass centered over the sample. Measurements were automatically made using the HP software provided.In the X-Band region, three absorption bands at 8.3, 9.4, and 11.5 GHz were detected for the substrate, with losses (absorption peaks) ranging from 13.5, 11.9, and 9.9, respectively. For the tin-oxide/iron-oxide sol-gel coated substrate, three bands at 8.4, 9.5, and 11.6 GHz were observed having losses of 16.2 to 13.4, 12.9 to 11.4. and 11.3 to 9.7, respectively, depending upon thickness and orientation. For the yttrium-iron-oxide sol-gel coated substrate, three bands at 8.4, 9.5, and 11.6, with losses depending upon solgel thickness and orientation.


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