scholarly journals New Approach for Thickness Determination of Solution-Deposited Graphene Thin Films

ACS Omega ◽  
2017 ◽  
Vol 2 (6) ◽  
pp. 2630-2638 ◽  
Author(s):  
Henri Jussila ◽  
Tom Albrow-Owen ◽  
He Yang ◽  
Guohua Hu ◽  
Sinan Aksimsek ◽  
...  
Keyword(s):  
Thin Films ◽  
New Approach ◽  
Thickness Determination

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques

2008 ◽  
Vol 516 (22) ◽  
pp. 7967-7973 ◽  
Author(s):  
K. Galicka-Fau ◽  
C. Legros ◽  
M. Andrieux ◽  
M. Herbst-Ghysel ◽  
I. Gallet ◽  
...  
Keyword(s):  
Thin Films ◽  
X Ray ◽  
Thickness Determination

Refractive index and thickness determination of thin-films using Lloyd’s interferometer

2003 ◽  
Vol 225 (4-6) ◽  
pp. 341-348 ◽  
Author(s):  
A.A. Hamza ◽  
M.A. Mabrouk ◽  
W.A. Ramadan ◽  
A.M. Emara
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Thickness Determination
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