Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips

ACS Nano ◽  
2015 ◽  
Vol 9 (4) ◽  
pp. 3858-3865 ◽  
Author(s):  
Daniel S. Wastl ◽  
Michael Judmann ◽  
Alfred J. Weymouth ◽  
Franz J. Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Ambient Conditions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oxygen Sublattices

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 2, No. 2A) ◽  
pp. L113-L115 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Akira Yoshimoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures

2016 ◽  
Author(s):  
Shama F. Barna ◽  
Kyle E. Jacobs ◽  
Glennys A. Mensing ◽  
Placid M. Ferreira
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Beam ◽  
Soft Materials ◽  
Constant Current ◽  
Silver Nanostructures ◽  
Direct Writing ◽  
Ambient Conditions ◽  
Commercial Development ◽  
Force Microscopy ◽  
Atomic Force

Rapid and cost effective fabrication of nanostructures is critical for experimental exploration and translation of results for commercial development. While conventional techniques such as E-beam or Focused Ion beam lithography serve some prototyping needs for nano-scale experimentations, cost and rate considerations prohibit use for manufacturing. Specialized lithographic processes [e.g. nanosphere lithography or interference lithography] are also powerful tools in creating nanostructures but provide limited shapes, positioning and size control of nanostructures. In this work, we demonstrated a liquid-free and mask-less electrochemical writing approach using atomic force microscopy (AFM) that is capable of making arbitrary shapes of silver nanostructures in seconds on a solid state super-ionic (AgI)x (AgPO3)(1−x) glass. Under ambient conditions. silver is extracted selectively on super-ionic (AgI)x (AgPO3)(1−x) glass surface by negatively biasing an AFM probe relative to an Ag film counter electrode. Both voltage controlled and current controlled writings demonstrated localized extraction of silver. The current controlled approach is shown to be the preferred writing approach to make repeatable and uniform patterns of silver on (AgI)x AgPO3(1−x), where x represents the mole fraction of AgI in the mixture and the control parameter that tunes the conductivity of the sample. We demonstrated current controlled printing of silver on two different compositions of the material (i.e. (AgI)0.125 (AgPO3 )0.875 and (AgI)0.25(AgPO3)0.75 ). Depending on the magnitude of the constant current and tip speed, line-width of the silver pattern can be ∼150 nm. The length of these patterns are limited to the maximum distance the tip can be moved using the AFM position controls. The substrate being optically transparent allows the use of this writing technique for rapid prototyping plasmonic devices. By using the patterned substrate as a template for replica molding of soft materials such as polydimethylsiloxane (PDMS), this writing technique can also be utilized for high throughput nano-channel fabrication in biofluidics and microfluidics devices.

scholarly journals High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

2014 ◽  
Vol 25 (17) ◽  
pp. 175701 ◽  
Author(s):  
Stefan A L Weber ◽  
Jason I Kilpatrick ◽  
Timothy M Brosnan ◽  
Suzanne P Jarvis ◽  
Brian J Rodriguez
Keyword(s):  
Atomic Force Microscopy ◽  
High Viscosity ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force
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