Construction of Single-Atom Platinum Catalysts Enabled by CsPbBr3 Nanocrystals

ACS Nano ◽  
2021 ◽  
Author(s):  
Huicheng Hu ◽  
Wenhao Guan ◽  
Yafeng Xu ◽  
Xuchun Wang ◽  
Linzhong Wu ◽  
...  
Author(s):  
Xiuqing Hao ◽  
Lingyun Dai ◽  
Jiguang Deng ◽  
Yuxi Liu ◽  
Lin Jing ◽  
...  

2017 ◽  
Vol 3 (6) ◽  
pp. 580-585 ◽  
Author(s):  
Xinjiang Cui ◽  
Kathrin Junge ◽  
Xingchao Dai ◽  
Carsten Kreyenschulte ◽  
Marga-Martina Pohl ◽  
...  

ACS Catalysis ◽  
2017 ◽  
Vol 7 (2) ◽  
pp. 1301-1307 ◽  
Author(s):  
Sungeun Yang ◽  
Young Joo Tak ◽  
Jiwhan Kim ◽  
Aloysius Soon ◽  
Hyunjoo Lee

ACS Catalysis ◽  
2018 ◽  
Vol 8 (5) ◽  
pp. 4044-4048 ◽  
Author(s):  
Pengfei Xie ◽  
Tiancheng Pu ◽  
Anmin Nie ◽  
Sooyeon Hwang ◽  
Stephen C. Purdy ◽  
...  

Author(s):  
Wah Chi

Resolution and contrast are the important factors to determine the feasibility of imaging single heavy atoms on a thin substrate in an electron microscope. The present report compares the atom image characteristics in different modes of fixed beam dark field microscopy including the ideal beam stop (IBS), a wire beam stop (WBS), tilted illumination (Tl) and a displaced aperture (DA). Image contrast between one Hg and a column of linearly aligned carbon atoms (representing the substrate), are also discussed. The assumptions in the present calculations are perfectly coherent illumination, atom object is represented by spherically symmetric potential derived from Relativistic Hartree Fock Slater wave functions, phase grating approximation is used to evaluate the complex scattering amplitude, inelastic scattering is ignored, phase distortion is solely due to defocus and spherical abberation, and total elastic scattering cross section is evaluated by the Optical Theorem. The atom image intensities are presented in a Z-modulation display, and the details of calculation are described elsewhere.


Author(s):  
J. J. Hren ◽  
S. D. Walck

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.


Author(s):  
JR Fryer ◽  
Z Huang ◽  
D Stirling ◽  
G. Webb

Platinum dispersed on γ-alumina is used as a reforming catalyst to convert linear hydrocarbons to cyclic aromatic products. To improve selectivity and lifetime of the catalyst, other elements are included, and we have studied the distributions of Pt/Re, and Pt/Sn, bimetallic systems on the support both before and after use in octane reforming. Often, one or both of the components are not resolvable by HREM or microanalysis as individual particles because of small size and lack of contrast on the alumina, and divergent beam microanalysis has been used to establish the presence and relationship between the two elements.In the majority of catalysts the platinum is in the form of small panicles, some of which are large enough to be resolvable in the microscope. The ABT002B microscope with Link windowless Pentafet detector, used in this work, was able to obtain a resolvable signal from particles of 2nm diameter upwards. When the beam was concentrated on to such a particle the signal was at a maximum, and as the beam diameter was diverged - at the same total beam intensity and dead time - the signal decreased as shown in Figure 1.


Author(s):  
G. L. Kellogg ◽  
P. R. Schwoebel

Although no longer unique in its ability to resolve individual single atoms on surfaces, the field ion microscope remains a powerful tool for the quantitative characterization of atomic processes on single-crystal surfaces. Investigations of single-atom surface diffusion, adatom-adatom interactions, surface reconstructions, cluster nucleation and growth, and a variety of surface chemical reactions have provided new insights to the atomic nature of surfaces. Moreover, the ability to determine the chemical identity of selected atoms seen in the field ion microscope image by atom-probe mass spectroscopy has increased or even changed our understanding of solid-state-reaction processes such as ordering, clustering, precipitation and segregation in alloys. This presentation focuses on the operational principles of the field-ion microscope and atom-probe mass spectrometer and some very recent applications of the field ion microscope to the nucleation and growth of metal clusters on metal surfaces.The structure assumed by clusters of atoms on a single-crystal surface yields fundamental information on the adatom-adatom interactions important in crystal growth. It was discovered in previous investigations with the field ion microscope that, contrary to intuition, the initial structure of clusters of Pt, Pd, Ir and Ni atoms on W(110) is a linear chain oriented in the <111> direction of the substrate.


Nanoscale ◽  
2020 ◽  
Vol 12 (15) ◽  
pp. 8065-8094 ◽  
Author(s):  
Xudong Wen ◽  
Jingqi Guan

Different kinds of electrocatalysts used in NRR electrocatalysis (including single atom catalysts, metal oxide catalysts, nanocomposite catalysts, and metal free catalysts) are introduced.


Sign in / Sign up

Export Citation Format

Share Document