scholarly journals Conductivity and Photoconductivity of a p-Type Organic Semiconductor under Ultrastrong Coupling

ACS Nano ◽  
2020 ◽  
Vol 14 (8) ◽  
pp. 10219-10225 ◽  
Author(s):  
Kalaivanan Nagarajan ◽  
Jino George ◽  
Anoop Thomas ◽  
Eloise Devaux ◽  
Thibault Chervy ◽  
...  
Keyword(s):  
2015 ◽  
Vol 3 (15) ◽  
pp. 7695-7698 ◽  
Author(s):  
Qian-Qian Zhang ◽  
Ke-Jian Jiang ◽  
Jin-Hua Huang ◽  
Chuan-Wu Zhao ◽  
Li-Peng Zhang ◽  
...  

A push–pull thienoquinoidal dye (QT-1), was synthesized as a sensitizer in a p-DSC, giving a high short-circuit photocurrent density of 8.2 mA cm−2. The result would pave new organic semiconductor sensitizers for use in p-DSCs and other organic optoelectronic devices.


2017 ◽  
Vol 29 (10) ◽  
pp. 1605053 ◽  
Author(s):  
Hui Jiang ◽  
Peng Hu ◽  
Jun Ye ◽  
Yongxin Li ◽  
Henan Li ◽  
...  

2018 ◽  
Vol 102 ◽  
pp. 449-455 ◽  
Author(s):  
Gintautas Bagdžiūnas ◽  
Šarūnas Žukauskas ◽  
Arūnas Ramanavičius

Materials ◽  
2020 ◽  
Vol 13 (7) ◽  
pp. 1583 ◽  
Author(s):  
Damien Thuau ◽  
Katherine Begley ◽  
Rishat Dilmurat ◽  
Abduleziz Ablat ◽  
Guillaume Wantz ◽  
...  

Organic semiconductors (OSCs) are promising transducer materials when applied in organic field-effect transistors (OFETs) taking advantage of their electrical properties which highly depend on the morphology of the semiconducting film. In this work, the effects of OSC thickness (ranging from 5 to 15 nm) on the piezoresistive sensitivity of a high-performance p-type organic semiconductor, namely dinaphtho [2,3-b:2,3-f] thieno [3,2–b] thiophene (DNTT), were investigated. Critical thickness of 6 nm thin film DNTT, thickness corresponding to the appearance of charge carrier percolation paths in the material, was demonstrated to be highly sensitive to mechanical strain. Gauge factors (GFs) of 42 ± 5 and −31 ± 6 were measured from the variation of output currents of 6 nm thick DNTT-based OFETs engineered on top of polymer cantilevers in response to compressive and tensile strain, respectively. The relationship between the morphologies of the different thin films and their corresponding piezoresistive sensitivities was discussed.


2015 ◽  
Vol 16 (3) ◽  
pp. 035003 ◽  
Author(s):  
Sandra Jenatsch ◽  
Thomas Geiger ◽  
Jakob Heier ◽  
Christoph Kirsch ◽  
Frank Nüesch ◽  
...  

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