Nanoscale Heterogeneities in Monolayer MoSe2 Revealed by Correlated Scanning Probe Microscopy and Tip-Enhanced Raman Spectroscopy

2018 ◽  
Vol 1 (2) ◽  
pp. 572-579 ◽  
Author(s):  
Kirby K. H. Smithe ◽  
Andrey V. Krayev ◽  
Connor S. Bailey ◽  
Hye Ryoung Lee ◽  
Eilam Yalon ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Tip Enhanced Raman Spectroscopy

scholarly journals Toward Robust High Resolution Chemical Imaging

2009 ◽  
Vol 17 (3) ◽  
pp. 36-37
Author(s):  
Carlos A. Barrios ◽  
Andrey V. Malkovskiy ◽  
Alexander Kisliuk ◽  
Alexei P. Sokolov ◽  
Mark D. Foster
Keyword(s):  
Raman Spectroscopy ◽  
Scanning Probe Microscopy ◽  
Noble Metals ◽  
Small Volume ◽  
Chemical Imaging ◽  
Scanning Probe ◽  
Lateral Resolution ◽  
Surface Enhanced ◽  
Tip Enhanced Raman Spectroscopy ◽  
20 Nm

Resonant plasmon excitations at the surface of noble metals can localize and amplify an electromagnetic field in a very small volume and are the enabling element of surface enhanced optical microscopies. Tip enhanced Raman spectroscopy (TERS) combines scanning probe microscopy (SPM) with Raman spectroscopy, taking advantage of this enhancing mechanism. So far a 20 nm lateral resolution in chemical imaging of a surface has been achieved. So far a 20 nm lateral resolution in chemical imaging of a surface has been achieved.

scholarly journals Combined Scanning Probe Microscopy and Confocal Raman Spectroscopy for Functional Imaging of the Layered Materials

2016 ◽  
Vol 22 (S3) ◽  
pp. 218-219
Author(s):  
Anton V. Ievlev ◽  
Michael A. Susner ◽  
Michael A. McGuire ◽  
Petro Maksymovych ◽  
Sergei V. Kalinin
Keyword(s):  
Raman Spectroscopy ◽  
Functional Imaging ◽  
Scanning Probe Microscopy ◽  
Layered Materials ◽  
Scanning Probe ◽  
Confocal Raman Spectroscopy ◽  
Probe Microscopy ◽  
Confocal Raman

Nanoscale Strain Mapping via Photo-Induced Force Microscopy

2017 ◽  
Author(s):  
Sung Park ◽  
Katie Park ◽  
Derek Nowak ◽  
Tom Albrecht ◽  
Erin Leigh Wood ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Scanning Probe Microscopy ◽  
Carrier Mobility ◽  
Local Strain ◽  
Scanning Probe ◽  
Strain Mapping ◽  
Force Microscopy ◽  
Infrared Excitation ◽  
Tip Enhanced Raman Spectroscopy

Abstract Carrier mobility enhancement through local strain in silicon is a means of improving transistor performance. Among the scanning probe microscopy based techniques, tip-enhanced Raman spectroscopy (TERS) has shown some promising results in measuring strain. However, TERS is known to depend critically on the quality of the plasmonic tip, which is difficult to control. In this study, a test structure is used to demonstrate the capability of photo-induced force microscopy with infrared excitation (IR PiFM) in direct measurement of strain with approximately 10 nm spatial resolution. For SiGe pitch less than about 800 nm, the region between the SiGe lines should maintain residual strain. For a region with SiGe pitch of 1000 nm, it is verified that the strain between the SiGe lines is fully relaxed. PiFM promises to be a powerful tool for studying nanoscale strain in diverse material.

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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