Ion-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples

2021 ◽  
Author(s):  
Shuo Zhang ◽  
Vivek Garg ◽  
Gediminas Gervinskas ◽  
Ross K.W. Marceau ◽  
Emily Chen ◽  
...  
Keyword(s):  
High Resolution ◽  
Resolution Electron ◽  
Electron Imaging

Analysis Of Oxygen Distribution In Interfaces In SiC Whisker Reinforced Si3 N4-Based Composites.

1991 ◽  
Vol 238 ◽  
Author(s):  
K. Das Chowdihury ◽  
R. W. Carpenter ◽  
W. Braue
Keyword(s):  
Silicon Carbide ◽  
Silicon Nitride ◽  
High Resolution ◽  
Grain Boundary ◽  
Oxygen Distribution ◽  
Interfacial Layers ◽  
Silicon Carbide Whisker ◽  
Resolution Electron ◽  
Analytical Microscopy ◽  
Electron Imaging

ABSTRACTDiscontinuous and continuous interfacial layers at the whisker/matrix and grain boundary interfaces in silicon carbide whisker reinforced silicon nitride based composites were investigated by high resolution electron imaging and analytical microscopy. Wide differences in chemical and structural widths of the interfaces were observed.

High-resolution electron imaging of amorphous layers with aberration-corrected probes

2008 ◽  
Vol 14 (S2) ◽  
pp. 940-941
Author(s):  
S Maccagnano-Zacher ◽  
A Mkhoyan ◽  
J Silcox
Keyword(s):  
New Mexico ◽  
High Resolution ◽  
Resolution Electron ◽  
Electron Imaging ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High resolution electron imaging system for sub-micron sized metastable atom beams produced by Stern–Gerlach interferometry

2005 ◽  
Vol 16 (10) ◽  
pp. 1997-2004 ◽  
Author(s):  
A R Milosavljević ◽  
V Bočvarski ◽  
J Jureta ◽  
B P Marinković ◽  
J-C Karam ◽  
...  
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Metastable Atom ◽  
Resolution Electron ◽  
Electron Imaging

scholarly journals Decoding crystallography from high-resolution electron imaging and diffraction datasets with deep learning

2019 ◽  
Vol 5 (10) ◽  
pp. eaaw1949 ◽  
Author(s):  
J. A. Aguiar ◽  
M. L. Gong ◽  
R. R. Unocic ◽  
T. Tasdizen ◽  
B. D. Miller
Keyword(s):  
Deep Learning ◽  
High Resolution ◽  
Worst Case ◽  
Space Groups ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Two Dimensional Materials ◽  
Diffraction Patterns ◽  
Reliable Classification ◽  
Electron Imaging

While machine learning has been making enormous strides in many technical areas, it is still massively underused in transmission electron microscopy. To address this, a convolutional neural network model was developed for reliable classification of crystal structures from small numbers of electron images and diffraction patterns with no preferred orientation. Diffraction data containing 571,340 individual crystals divided among seven families, 32 genera, and 230 space groups were used to train the network. Despite the highly imbalanced dataset, the network narrows down the space groups to the top two with over 70% confidence in the worst case and up to 95% in the common cases. As examples, we benchmarked against alloys to two-dimensional materials to cross-validate our deep-learning model against high-resolution transmission electron images and diffraction patterns. We present this result both as a research tool and deep-learning application for diffraction analysis.

High Resolution Electron Microscopy of A Nicl2 – Intercalated Graphite

1982 ◽  
Vol 20 ◽  
Author(s):  
D. Dorignac ◽  
M.J. Lahana ◽  
R. Jagut ◽  
B. Jouffrey ◽  
S. Flandrois ◽  
...  
Keyword(s):  
High Resolution ◽  
Local Structure ◽  
High Resolution Electron Microscopy ◽  
Image Simulation ◽  
Statistical Nature ◽  
Structure Information ◽  
Second Stage ◽  
Intercalated Graphite ◽  
Resolution Electron ◽  
Electron Imaging

ABSTRACTHigh resolution electron imaging supported by computer image simulation has been carried out for a nominal “second–stage” NiCl2 graphite compound. The resulting local structure information underlines the statistical nature of the stage ordering, rarely perfectly regular. It also shows the interpenetration of differently staged regions.

scholarly journals Transfer-Printing of Single DNA Molecule Arrays on Graphene for High-Resolution Electron Imaging and Analysis

Nano Letters ◽  
2011 ◽  
Vol 11 (10) ◽  
pp. 4232-4238 ◽  
Author(s):  
Aline Cerf ◽  
Thomas Alava ◽  
Robert A. Barton ◽  
Harold G. Craighead
Keyword(s):  
High Resolution ◽  
Transfer Printing ◽  
Dna Molecule ◽  
Resolution Electron ◽  
Electron Imaging ◽  
Single Dna Molecule

The ultimate reliability of high-resolution electron imaging

1987 ◽  
Vol 45 ◽  
pp. 10-13
Author(s):  
W. O. Saxton
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Optical System ◽  
High Resolution Electron Microscopy ◽  
Experimental Science ◽  
Atomic Column ◽  
Independent Variables ◽  
Resolution Electron ◽  
Complicating Factors ◽  
Electron Imaging

High resolution electron microscopy is patently an experimental science; yet what we do with high resolution microscopes does not always deserve the designation of ‘experimenting’ at all. Good experiments involve the observation of one set of (’dependent’ - preferably strongly dependent) quantities while another set (the ‘independent’ quantities) is varied systematically. We have however quite insufficient control of most of the independent variables in our experiments: a specimen prepared in a more or less brutal fashion, with an inaccurately known thickness, is placed under a highly damaging beam, and examined through an optical system whose adjustment, though known to be critical, is still rather more of an art than a science, yielding a micrograph covered with bright and dark lines and/or spots; while some of us then suppose that these directly reveal atomic column positions to within 5pm, others are so cautious about the various possible complicating factors that we are unable to draw the simplest inferences from the image with confidence.

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