Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3 Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses
2019 ◽
Vol 11
(26)
◽
pp. 23673-23680
◽
1999 ◽
Vol 146
(6)
◽
pp. 626
◽
2013 ◽
Vol 51
(7)
◽
pp. 523-527
◽
2020 ◽
Vol 15
(1)
◽
pp. 26
Keyword(s):
2017 ◽
Vol 12
(2)
◽
pp. 142
2009 ◽
Vol E92-A
(4)
◽
pp. 990-997