Stress-Induced Crystallization of Thin Hf1–XZrXO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications
2019 ◽
Vol 11
(5)
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pp. 5208-5214
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2020 ◽
Vol 8
(26)
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pp. 8962-8970
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2013 ◽
Vol 96
(9)
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pp. 2699-2702
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2019 ◽
Vol 102
(7)
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pp. 3819-3822
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Keyword(s):
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