Domain Evolution and Piezoelectric Response across Thermotropic Phase Boundary in (K,Na)NbO3-Based Epitaxial Thin Films

2017 ◽  
Vol 9 (15) ◽  
pp. 13315-13322 ◽  
Author(s):  
Jin Luo ◽  
Wei Sun ◽  
Zhen Zhou ◽  
Yu Bai ◽  
Zhan Jie Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Boundary ◽  
Piezoelectric Response ◽  
Epitaxial Thin Films ◽  
Domain Evolution

Domain evolution of tetragonal Pb(ZrxTi1−x) O3 piezoelectric thin films on SrTiO3 (100) surfaces: combined effects of misfit strain and Zr/Ti ratio

2014 ◽  
Vol 2 (29) ◽  
pp. 5836-5841 ◽  
Author(s):  
Qi Yu ◽  
Jing-Feng Li ◽  
Fang-Yuan Zhu ◽  
Jiangyu Li
Keyword(s):  
Thin Films ◽  
Misfit Strain ◽  
Epitaxial Thin Films ◽  
Combined Effects ◽  
Piezoelectric Thin Films ◽  
Domain Evolution ◽  
Ferroelectric Domains ◽  
Substrate Constraint

The ferroelectric domains of tetragonal Pb(ZrxTi1−x)O3 epitaxial thin films have been studied comprehensively to reveal their piezoelectric responses under substrate constraint.

Piezoelectric effect in epitaxial PbZr1−xTixO3 thin films near morphotropic phase boundary region

2005 ◽  
Vol 20 (4) ◽  
pp. 787-790 ◽  
Author(s):  
Yong Kwan Kim ◽  
Sang Sub Kim ◽  
Bongki Lee ◽  
Hyunjung Shin ◽  
Sunggi Baik
Keyword(s):  
Thin Films ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Volume Fraction ◽  
Scanning Force Microscopy ◽  
Boundary Region ◽  
Structural Instability ◽  
Piezoelectric Response ◽  
Storage Devices ◽  
Pzt Films

The relationship between crystal structure and piezo-response was investigated in epitaxially grown PbZr1−xTixO3 (PZT) thin films on Pt(001)/MgO(001) with a thin PbTiO3 interlayer. Insertion of the interlayer resulted in significant relaxation ofthe strain that could be developed in the course of deposition of the PZT films, consequently leading us to single out only the effect of composition. Composition of the morphotropic phase boundary (MPB), at which tetragonal and rhombohedral phases are mixed with the same volume fraction, was found to be ∼0.55 in Ti/(Zr + Ti) ratio in our films, which is close to the value for bulk polycrystalline PZT (∼0.50). The piezoelectric response peaks were two times higher in the MPB regime than in the single phase regime due to structural instability caused by the coexistence of two phases. The results indicate that epitaxial PZT films having the MPB composition are advantageous over those of other compositions for nano-storage devices based on scanning force microscopy.

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