Optimization of a Solution-Processed SiO2 Gate Insulator by Plasma Treatment for Zinc Oxide Thin Film Transistors
2016 ◽
Vol 8
(3)
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pp. 2061-2070
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2016 ◽
Vol 16
(12)
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pp. 12871-12874
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2018 ◽
Vol 18
(3)
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pp. 315-320
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2010 ◽
Vol 57
(5)
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pp. 1009-1014
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