scholarly journals Macromolecular Design via an Organocatalytic, Monomer-Specific and Temperature-Dependent “On/Off Switch”. High Precision Synthesis of Polyester/Polycarbonate Multiblock Copolymers

2015 ◽  
Vol 48 (6) ◽  
pp. 1703-1710 ◽  
Author(s):  
Peter Olsén ◽  
Karin Odelius ◽  
Helmut Keul ◽  
Ann-Christine Albertsson
Keyword(s):  
High Precision ◽  
Multiblock Copolymers ◽  
Temperature Dependent ◽  
Precision Synthesis

High-precision synthesis of α-MnO2 nanowires with controllable crystal facets for propane oxidation

CrystEngComm ◽  
2021 ◽  
Author(s):  
Chao Feng ◽  
Gaoyan Xiong ◽  
Yaping Li ◽  
Qianqian Gao ◽  
Yuan Pan ◽  
...  
Keyword(s):  
High Precision ◽  
Propane Oxidation ◽  
Oxidation Catalyst ◽  
Crystal Facet ◽  
Reaction Performance ◽  
Precision Synthesis ◽  
Mno2 Nanowires

Determining the effect of crystal facet on the reaction performance is essential for designing an efficient propane oxidation catalyst. Herein, α-MnO2 nanowires with exposed (110), (211), (310) and (200) facets...

High Precision Synthesis of a Richards Immittance Via Parametric Approach

2014 ◽  
Vol 61 (4) ◽  
pp. 1055-1067 ◽  
Author(s):  
Binboga Siddik Yarman ◽  
Ramazan Kopru ◽  
Narendra Kumar ◽  
Chacko Prakash
Keyword(s):  
High Precision ◽  
Parametric Approach ◽  
Precision Synthesis

Temperature dependent electron scattering rates in aluminium from high precision RFSE measurements between 0.2 and 10K.

1994 ◽  
Vol 194-196 ◽  
pp. 1177-1178
Author(s):  
Alain Jaquier ◽  
Pierre-Alain Probst ◽  
Robert Huguenin ◽  
Rene´ Stubi
Keyword(s):  
High Precision ◽  
Electron Scattering ◽  
Temperature Dependent ◽  
Scattering Rates

Development of high throughput, high precision synthesis platforms and characterization methodologies for toxicological studies of nanocellulose

Cellulose ◽  
2018 ◽  
Vol 25 (4) ◽  
pp. 2303-2319 ◽  
Author(s):  
Georgios Pyrgiotakis ◽  
Wing Luu ◽  
Zhenyuan Zhang ◽  
Nachiket Vaze ◽  
Glen DeLoid ◽  
...  
Keyword(s):  
High Precision ◽  
High Throughput ◽  
Toxicological Studies ◽  
Precision Synthesis

(111) Monocrystalline Nickel Films

1972 ◽  
Vol 30 ◽  
pp. 512-513
Author(s):  
T.E. Pratt ◽  
R.W. Vook
Keyword(s):  
Film Thickness ◽  
Deposition Rate ◽  
Room Temperature ◽  
Narrow Range ◽  
High Vacuum ◽  
Residual Pressure ◽  
Temperature Dependent ◽  
Deposition Parameters ◽  
Transmission Electron ◽  
Substrate Temperatures

(111) oriented thin monocrystalline Ni films have been prepared by vacuum evaporation and examined by transmission electron microscopy and electron diffraction. In high vacuum, at room temperature, a layer of NaCl was first evaporated onto a freshly air-cleaved muscovite substrate clamped to a copper block with attached heater and thermocouple. Then, at various substrate temperatures, with other parameters held within a narrow range, Ni was evaporated from a tungsten filament. It had been shown previously that similar procedures would yield monocrystalline films of CU, Ag, and Au.For the films examined with respect to temperature dependent effects, typical deposition parameters were: Ni film thickness, 500-800 A; Ni deposition rate, 10 A/sec.; residual pressure, 10-6 torr; NaCl film thickness, 250 A; and NaCl deposition rate, 10 A/sec. Some additional evaporations involved higher deposition rates and lower film thicknesses.Monocrystalline films were obtained with substrate temperatures above 500° C. Below 450° C, the films were polycrystalline with a strong (111) preferred orientation.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

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