scholarly journals Inter- and Intragrain Inhomogeneity in 2D Perovskite Thin Films Revealed by Relative Grain Orientation Imaging Using Low-Frequency Polarized Raman Microspectroscopy

2020 ◽  
Vol 11 (10) ◽  
pp. 3871-3876
Author(s):  
Shogo Toda ◽  
Naoya Yanagita ◽  
Efat Jokar ◽  
Eric Wei-Guang Diau ◽  
Shinsuke Shigeto
Keyword(s):  
Thin Films ◽  
Grain Orientation ◽  
Low Frequency ◽  
Raman Microspectroscopy ◽  
Orientation Imaging ◽  
Polarized Raman

Rapid grain orientation imaging using spatially resolved acoustic spectroscopy

2007 ◽  
Author(s):  
Steve D. Sharples ◽  
Matt Clark ◽  
Mike G. Somekh ◽  
Elizabeth E. Sackett ◽  
Lionel Germain ◽  
...  
Keyword(s):  
Grain Orientation ◽  
Orientation Imaging ◽  
Spatially Resolved ◽  
Acoustic Spectroscopy

Preferential orientation and relaxation behaviors of CaCu3Ti4O12 thin films in a low frequency range

2017 ◽  
Vol 704 ◽  
pp. 676-682 ◽  
Author(s):  
Kang Sun ◽  
Ling-Fang Xu ◽  
Cong Mao ◽  
Xing Feng ◽  
Jia-Yu Liang ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Frequency ◽  
Preferential Orientation ◽  
Frequency Range

Structure Development during ECAP and Subsequent Creep of Aluminium

2007 ◽  
Vol 539-543 ◽  
pp. 493-498 ◽  
Author(s):  
Ivan Saxl ◽  
Vàclav Sklenička ◽  
L. Ilucová ◽  
Milan Svoboda ◽  
Petr Král
Keyword(s):  
High Purity ◽  
Grain Orientation ◽  
Orientation Imaging Microscopy ◽  
Structural Inhomogeneity ◽  
Structure Development ◽  
Creep Fracture ◽  
Orientation Imaging ◽  
Purity Aluminium ◽  
High Purity Aluminium ◽  
Creep Loading

Considerable structural inhomogeneity and anisotropy were found even after eight ECAP passes in high purity aluminium and the creep loading of ECAP material at 473K, 15MPa resulted in scattered fracture times ~ 20-60 hours. The structure revealed by orientation imaging microscopy with different disclination bounds was analysed by stereological methods. The effect of inhomogeneity and grain orientation on the creep fracture time was assessed.

Effect of Crystal Grain Orientation on the Rate of Ionic Transport in Perovskite Polycrystalline Thin Films

2018 ◽  
Vol 11 (2) ◽  
pp. 2490-2499 ◽  
Author(s):  
Paul Fassl ◽  
Simon Ternes ◽  
Vincent Lami ◽  
Yuriy Zakharko ◽  
Daniel Heimfarth ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Orientation ◽  
Ionic Transport ◽  
Polycrystalline Thin Films

Disorder-Induced Low-Frequency Raman Band Observed in Deposited MoS2 Films

1994 ◽  
Vol 48 (6) ◽  
pp. 733-736 ◽  
Author(s):  
N. T. McDevitt ◽  
J. S. Zabinski ◽  
M. S. Donley ◽  
J. E. Bultman
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Raman Band ◽  
Low Frequency ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
First Order ◽  
Order Spectrum ◽  
History Of ◽  
Frequency Feature

Crystalline disorder in thin films plays an important role in determining their properties. Disorder in the crystal structure of MoS2 films prepared by magnetron sputtering and pulsed laser deposition was evaluated with the use of Raman spectroscopy. The peak positions and bandwidths of the first-order Raman bands, in the region 100 to 500 cm−1, were used as a measure of crystalline order. In addition, a low-frequency feature was observed at 223 cm−1 that is not part of the normal first-order spectrum of a fully crystalline specimen. Data presented here demonstrate that this band is characteristic of crystalline disorder, and its intensity depends on the annealing history of the film. This behavior seems to be analogous to the disorder found in graphite thin films.

Low-frequency dielectric functions of dense and chevronic thin films of parylene C

2013 ◽  
Vol 95 ◽  
pp. 63-66 ◽  
Author(s):  
Abdelkader Kahouli ◽  
Lai Wei ◽  
Akhlesh Lakhtakia ◽  
Alain Sylvestre
Keyword(s):  
Thin Films ◽  
Low Frequency ◽  
Parylene C
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