scholarly journals Selective Probing of Thin-Film Interfaces Using Internal Reflection Sum-Frequency Spectroscopy

2019 ◽  
Vol 123 (38) ◽  
pp. 23535-23544 ◽  
Author(s):  
Md. Shafiul Azam ◽  
Canyu Cai ◽  
Dennis K. Hore
Keyword(s):  
Thin Film ◽  
Internal Reflection ◽  
Sum Frequency ◽  
Sum Frequency Spectroscopy

Combining Total Internal Reflection Sum Frequency Spectroscopy Spectral Imaging and Confocal Fluorescence Microscopy

Langmuir ◽  
2015 ◽  
Vol 31 (3) ◽  
pp. 987-994 ◽  
Author(s):  
Edward S. Allgeyer ◽  
Sarah M. Sterling ◽  
Mudalige S. Gunewardene ◽  
Samuel T. Hess ◽  
David J. Neivandt ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Spectral Imaging ◽  
Internal Reflection ◽  
Confocal Fluorescence Microscopy ◽  
Sum Frequency ◽  
Sum Frequency Spectroscopy ◽  
Confocal Fluorescence
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