scholarly journals The Chemical Bond between Transition Metals and Oxygen: Electronegativity, d-Orbital Effects, and Oxophilicity as Descriptors of Metal–Oxygen Interactions

2019 ◽  
Vol 123 (30) ◽  
pp. 18432-18444 ◽  
Author(s):  
Klaus A. Moltved ◽  
Kasper P. Kepp
Keyword(s):  
Transition Metals ◽  
Chemical Bond

scholarly journals Nature of 3d – transition metals chemical bond of in carbon nanotubes

2018 ◽  
Author(s):  
N. I. Salmanova ◽  
E. B. Zeynalov ◽  
M. M. Agaguseynova
Keyword(s):  
Carbon Nanotubes ◽  
Transition Metals ◽  
Chemical Bond

The chemical bond in dimers of group V and group VII transition metals

1987 ◽  
Vol 28 (1) ◽  
pp. 31-37 ◽  
Author(s):  
A. P. Klyagina ◽  
V. D. Fursova ◽  
A. A. Levin ◽  
G. L. Gutsev
Keyword(s):  
Transition Metals ◽  
Chemical Bond ◽  
Group V

Precipitation in silicon: Microanalysis

1988 ◽  
Vol 46 ◽  
pp. 474-475
Author(s):  
R.W. Carpenter
Keyword(s):  
Transition Metals ◽  
Spatial Resolution ◽  
Thin Foil ◽  
Precipitation Reaction ◽  
High Current ◽  
Reaction Products ◽  
Carbon And Nitrogen ◽  
Dielectric Layers ◽  
Precipitation Processes ◽  
Areas Of Interest

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.

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