Estimation of the Charge Injection Barrier at a Metal/Organic Semiconductor Interface Based on Accumulated Charge Measurement: The Effect of Offset Bias Voltages
2017 ◽
Vol 121
(27)
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pp. 14725-14730
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2014 ◽
Vol 252
(2)
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pp. 404-410
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2004 ◽
Vol 396
(1-3)
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pp. 92-96
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2005 ◽
Vol 44
(6A)
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pp. 3751-3756
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1976 ◽
Vol 75
(1)
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pp. 247-254
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