Quality Control of GaAs Nanowire Structures by Limiting As Flux in Molecular Beam Epitaxy

2015 ◽  
Vol 119 (35) ◽  
pp. 20721-20727 ◽  
Author(s):  
Chen Zhou ◽  
Kun Zheng ◽  
Zhenyu Lu ◽  
Zhi Zhang ◽  
Zhiming Liao ◽  
...  
2008 ◽  
Vol 42 (12) ◽  
pp. 1445-1449 ◽  
Author(s):  
Yu. B. Samsonenko ◽  
G. É. Cirlin ◽  
V. A. Egorov ◽  
N. K. Polyakov ◽  
V. P. Ulin ◽  
...  

1998 ◽  
Vol 12 (11) ◽  
pp. 1147-1170 ◽  
Author(s):  
Ralf D. Tscheuschner ◽  
Sascha Hoch ◽  
Eva Leschinsky ◽  
Cedrik Meier ◽  
Sabine Theis ◽  
...  

We measure the IQHE on macroscopic (1.5 cm × 1.5 cm) "quick and dirty" prepared III–V heterostructure samples with van der Pauw and modified Corbino geometries at 1.3 K. We compare our results with (i) data taken on smaller specimens, among them samples with a standard Hall bar geometry, (ii) results of our numerical analysis taking inhomogenities of the 2DEG into account. Our main finding is a confirmation of the expected robustness of the IQHE which favors the development of wide plateaux for small filling factors and very large samples sizes (here with areas 10 000 times larger than in standard arrangements).


Author(s):  
Е.А. Емельянов ◽  
А.Г. Настовьяк ◽  
М.О. Петрушков ◽  
М.Ю. Есин ◽  
Т.А. Гаврилова ◽  
...  

GaAs nanowire (NW) self-catalyzed growth on GaAs (111) B and GaAs (100) substrates was carried out by molecular beam epitaxy. A mask for the self-catalyzed NW growth was created by oxidizing an epitaxial silicon layer grown on the GaAs surface by molecular beam epitaxy (MBE). Silicon oxidation was realized in an atmosphere of purified air under normal conditions without moving the structures out from the vacuum system volume of the molecular beam epitaxy chamber. The oxidation process of a silicon layer was studied using single-wave and spectral ellipsometry and the surface morphology of oxidized silicon was studied by atomic force microscopy. Substrates with NWs were studied by scanning electron microscopy. The NW density was demonstrated to be 2.6•107 cm-2 and 3•107 cm-2 for (111)B and (100), respectively.


2006 ◽  
Vol 17 (16) ◽  
pp. 4025-4030 ◽  
Author(s):  
M Tchernycheva ◽  
J C Harmand ◽  
G Patriarche ◽  
L Travers ◽  
G E Cirlin

2002 ◽  
Vol 81 (27) ◽  
pp. 5177-5179 ◽  
Author(s):  
Z. H. Wu ◽  
X. Y. Mei ◽  
D. Kim ◽  
M. Blumin ◽  
H. E. Ruda

2011 ◽  
Author(s):  
J. Kwoen ◽  
N. Kumagai ◽  
K. Watanabe ◽  
S. Ohkouchi ◽  
S. Iwamoto ◽  
...  

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