scholarly journals Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

2015 ◽  
Vol 119 (12) ◽  
pp. 6670-6677 ◽  
Author(s):  
Mehmet Z. Baykara ◽  
Milica Todorović ◽  
Harry Mönig ◽  
Todd C. Schwendemann ◽  
Lucia Rodrigo ◽  
...  
2003 ◽  
Vol 80 (2) ◽  
pp. 194 ◽  
Author(s):  
Chuan-Jian Zhong ◽  
Li Han ◽  
Mathew M. Maye ◽  
Jin Luo ◽  
Nancy N. Kariuki ◽  
...  

2012 ◽  
Vol 3 ◽  
pp. 852-859 ◽  
Author(s):  
Baran Eren ◽  
Dorothée Hug ◽  
Laurent Marot ◽  
Rémy Pawlak ◽  
Marcin Kisiel ◽  
...  

Single- and multilayer graphene and highly ordered pyrolytic graphite (HOPG) were exposed to a pure hydrogen low-temperature plasma (LTP). Characterizations include various experimental techniques such as photoelectron spectroscopy, Raman spectroscopy and scanning probe microscopy. Our photoemission measurement shows that hydrogen LTP exposed HOPG has a diamond-like valence-band structure, which suggests double-sided hydrogenation. With the scanning tunneling microscopy technique, various atomic-scale charge-density patterns were observed, which may be associated with different C–H conformers. Hydrogen-LTP-exposed graphene on SiO2 has a Raman spectrum in which the D peak to G peak ratio is over 4, associated with hydrogenation on both sides. A very low defect density was observed in the scanning probe microscopy measurements, which enables a reverse transformation to graphene. Hydrogen-LTP-exposed HOPG possesses a high thermal stability, and therefore, this transformation requires annealing at over 1000 °C.


Open Physics ◽  
2012 ◽  
Vol 10 (1) ◽  
Author(s):  
David Nečas ◽  
Petr Klapetek

AbstractIn this article, we review special features of Gwyddion—a modular, multiplatform, open-source software for scanning probe microscopy data processing, which is available at http://gwyddion.net/. We describe its architecture with emphasis on modularity and easy integration of the provided algorithms into other software. Special functionalities, such as data processing from non-rectangular areas, grain and particle analysis, and metrology support are discussed as well. It is shown that on the basis of open-source software development, a fully functional software package can be created that covers the needs of a large part of the scanning probe microscopy user community.


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