Surface Characterization of Aspirin Crystal Planes by Dynamic Chemical Force Microscopy

2000 ◽  
Vol 72 (15) ◽  
pp. 3419-3422 ◽  
Author(s):  
Ardeshir Danesh ◽  
Martyn C. Davies ◽  
Steven J. Hinder ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
...  
Keyword(s):  
Surface Characterization ◽  
Force Microscopy ◽  
Chemical Force Microscopy ◽  
Chemical Force

Surface Ionization State and Nanoscale Chemical Composition of UV-Irradiated Poly(dimethylsiloxane) Probed by Chemical Force Microscopy, Force Titration, and Electrokinetic Measurements

Langmuir ◽  
2007 ◽  
Vol 23 (10) ◽  
pp. 5430-5438 ◽  
Author(s):  
Jing Song ◽  
Jérôme F. L. Duval ◽  
Martien A. Cohen Stuart ◽  
Henrik Hillborg ◽  
Ullrich Gunst ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Surface Ionization ◽  
Ionization State ◽  
Force Microscopy ◽  
Chemical Force Microscopy ◽  
Chemical Force

Charge-transfer complexes interactions evidenced by chemical force microscopy

2003 ◽  
pp. 2234 ◽  
Author(s):  
Richard Gil ◽  
Jean-Claude Fiaud ◽  
Jean-Claude Poulin ◽  
Emmanuelle Schulz
Keyword(s):  
Charge Transfer ◽  
Charge Transfer Complexes ◽  
Force Microscopy ◽  
Chemical Force Microscopy ◽  
Chemical Force
Sign in / Sign up

Export Citation Format

Share Document