Interchain Ion Formation in Secondary Ion Mass Spectrometry Resulting from the Double-Helical Structure of Isotactic Poly(methyl methacrylate) in Adsorbed Monolayers

R. W. Nowak;  Gardella,; T. D. Wood; P. A. Zimmerman; D. M. Hercules

doi:10.1021/ac991447x

Interchain Ion Formation in Secondary Ion Mass Spectrometry Resulting from the Double-Helical Structure of Isotactic Poly(methyl methacrylate) in Adsorbed Monolayers

Analytical Chemistry ◽

10.1021/ac991447x ◽

2000 ◽

Vol 72 (19) ◽

pp. 4585-4590 ◽

Cited By ~ 9

Author(s):

R. W. Nowak ◽

Gardella, ◽

T. D. Wood ◽

P. A. Zimmerman ◽

D. M. Hercules

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Secondary Ion Mass Spectrometry ◽

Helical Structure ◽

Poly Methyl Methacrylate ◽

Double Helical Structure ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.7801 ◽

2017 ◽

Vol 31 (4) ◽

pp. 381-388 ◽

Cited By ~ 6

Author(s):

Soheila Naderi-Gohar ◽

Kevin M.H. Huang ◽

Yiliang Wu ◽

Woon Ming Lau ◽

Heng-Yong Nie

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Poly Methyl Methacrylate ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Impact Energy Dependence of SF5+-Induced Damage in Poly(methyl methacrylate) Studied Using Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac035330r ◽

2004 ◽

Vol 76 (5) ◽

pp. 1264-1272 ◽

Cited By ~ 39

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Energy Dependence ◽

Impact Energy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Poly Methyl Methacrylate ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects

Analytical Chemistry ◽

10.1021/ac061357+ ◽

2007 ◽

Vol 79 (3) ◽

pp. 837-845 ◽

Cited By ~ 38

Author(s):

Christine M. Mahoney ◽

Albert J. Fahey ◽

Greg Gillen ◽

Chang Xu ◽

James D. Batteas

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Poly Methyl Methacrylate ◽

Chemical Damage ◽

Ion Mass Spectrometry ◽

Temperature Controlled ◽

Secondary Ion

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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

Analytical Chemistry ◽

10.1021/ac061356h ◽

2007 ◽

Vol 79 (3) ◽

pp. 828-836 ◽

Cited By ~ 56

Author(s):

Christine M. Mahoney ◽

Albert J. Fahey ◽

Greg Gillen

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Depth Profile ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Poly Methyl Methacrylate ◽

Ion Mass Spectrometry ◽

Temperature Controlled ◽

Profile Characteristics ◽

Secondary Ion

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Characterization and ion-induced degradation of cross-linked poly(methyl methacrylate) studied using time of flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2006.05.022 ◽

2006 ◽

Vol 253 (5) ◽

pp. 2603-2610 ◽

Cited By ~ 14

Author(s):

M.S. Wagner ◽

K. Lenghaus ◽

G. Gillen ◽

M.J. Tarlov

Keyword(s):

Mass Spectrometry ◽

Methyl Methacrylate ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Poly Methyl Methacrylate ◽

Ion Mass Spectrometry ◽

Secondary Ion

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An empirical model for ion formation from polymer surfaces during analysis by secondary ion mass spectrometry

International Journal of Mass Spectrometry and Ion Processes ◽

10.1016/0168-1176(92)87021-6 ◽

1992 ◽

Vol 122 ◽

pp. 281-319 ◽

Cited By ~ 47

Author(s):

Graham J. Leggett ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Empirical Model ◽

Secondary Ion Mass Spectrometry ◽

Polymer Surfaces ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry

Journal of the American Society for Mass Spectrometry ◽

10.1016/j.jasms.2007.05.014 ◽

2007 ◽

Vol 18 (8) ◽

pp. 1559-1567 ◽

Cited By ~ 55

Author(s):

Emrys A. Jones ◽

Nicholas P. Lockyer ◽

Jeanette Kordys ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Chemical Environment ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Study on ion formation in electrospray droplet impact secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.3004 ◽

2007 ◽

Vol 21 (10) ◽

pp. 1579-1586 ◽

Cited By ~ 36

Author(s):

Daiki Asakawa ◽

Susumu Fujimaki ◽

Yutaka Hashimoto ◽

Kunihiko Mori ◽

Kenzo Hiraoka

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Droplet Impact ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Secondary Ion

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The effect of a glycerol matrix on the cluster ion formation from salts in secondary ion mass spectrometry

International Journal of Mass Spectrometry and Ion Processes ◽

10.1016/0168-1176(86)80044-1 ◽

1986 ◽

Vol 70 (2) ◽

pp. 135-144 ◽

Cited By ~ 14

Author(s):

S.S. Wong ◽

F.W. Röllgen

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion ◽

Glycerol Matrix

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Salt Effects on Ion Formation in Desorption Mass Spectrometry: An Investigation into the Role of Alkali Chlorides on Peak Suppression in Time-of-Flight-Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac8020888 ◽

2009 ◽

Vol 81 (3) ◽

pp. 1040-1048 ◽

Cited By ~ 40

Author(s):

Alan M. Piwowar ◽

Nick P. Lockyer ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Salt Effects ◽

Desorption Mass Spectrometry ◽

Ion Formation ◽

Ion Mass Spectrometry ◽

Alkali Chlorides ◽

Secondary Ion

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