Helium Plasma Source Time-of-Flight Mass Spectrometry:  Off-Cone Sampling for Elemental Analysis

2000 ◽  
Vol 72 (11) ◽  
pp. 2455-2462 ◽  
Author(s):  
Yongxuan Su ◽  
Yixiang Duan ◽  
Zhe Jin
Keyword(s):  
Mass Spectrometry ◽  
Elemental Analysis ◽  
Time Of Flight ◽  
Plasma Source ◽  
Helium Plasma ◽  
Flight Mass Spectrometry

Constant-Fraction Discrimination/Boxcar Integrator for Plasma Source Time-of-Flight Mass Spectrometry

1995 ◽  
Vol 49 (5) ◽  
pp. 660-664 ◽  
Author(s):  
Pengyuan Yang ◽  
David P. Myers ◽  
Gangqiang Li ◽  
Gary M. Hieftje
Keyword(s):  
Mass Spectrometry ◽  
Inductively Coupled Plasma ◽  
Dynamic Range ◽  
Detection System ◽  
Signal To Noise Ratio ◽  
Time Of Flight ◽  
Plasma Source ◽  
Flight Mass Spectrometry ◽  
Lower Amplitude ◽  
Boxcar Integrator

A constant-fraction discrimination (CFD) system has been combined with a boxcar integrator for detection in inductively coupled plasma/time-of-flight mass spectrometry. The discriminator provides gating logic for the boxcar integrator when an incoming ion signal occurs, but discriminates against electronic or background noise of lower amplitude. As a result, the combination can effectively reject noise and accumulate analyte signal, rather than relying on an averaging process to reduce noise levels. The signal-to-noise ratio is therefore enhanced in this operation compared with the conventional boxcar method. The dynamic range of the detection system is at least five orders of magnitude.

Laser ionization time-of-flight mass spectrometry for direct elemental analysis

2009 ◽  
Vol 28 (10) ◽  
pp. 1174-1185 ◽  
Author(s):  
Quan Yu ◽  
Lizhi Chen ◽  
Rongfu Huang ◽  
Wei Hang ◽  
Benli Huang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Elemental Analysis ◽  
Time Of Flight ◽  
Laser Ionization ◽  
Ionization Time ◽  
Flight Mass Spectrometry
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