High-Energy Polarized-Beam Energy-Dispersive X-ray Fluorescence Analysis Combined with Activated Thin Layers for Cadmium Determination at Trace Levels in Complex Environmental Liquid Samples

2008 ◽  
Vol 80 (7) ◽  
pp. 2357-2364 ◽  
Author(s):  
Eva Marguí ◽  
Clàudia Fontàs ◽  
Katleen Van Meel ◽  
René Van Grieken ◽  
Ignasi Queralt ◽  
...  
Keyword(s):  
Beam Energy ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Thin Layers ◽  
Energy Dispersive ◽  
Cadmium Determination ◽  
X Ray ◽  
Liquid Samples ◽  
Polarized Beam

Application of high-energy polarised beam energy dispersive X-ray fluorescence spectrometry to cadmium determination in saline solutions

2008 ◽  
Vol 23 (7) ◽  
pp. 1034 ◽  
Author(s):  
Katleen Van Meel ◽  
Clàudia Fontàs ◽  
René Van Grieken ◽  
Ignasi Queralt ◽  
Manuela Hidalgo ◽  
...  
Keyword(s):  
Beam Energy ◽  
High Energy ◽  
Energy Dispersive ◽  
Fluorescence Spectrometry ◽  
Cadmium Determination ◽  
X Ray ◽  
Saline Solutions

X-Ray Reflectometry from Semiconductor Surfaces and Interfaces

1990 ◽  
Vol 208 ◽  
Author(s):  
Brian K Tanner ◽  
Simon J Miles ◽  
D Keith Bowen ◽  
Linda Hart ◽  
Neil Loxley
Keyword(s):  
Surface Damage ◽  
Grazing Incidence ◽  
High Energy ◽  
Thin Layers ◽  
Energy Dispersive ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Surfaces And Interfaces ◽  
Langmuir Blodgett Films ◽  
Preliminary Study

ABSTRACTX-ray reflectance measurements at grazing incidence provide non-destructively a measure of the thickness of thin layers, the electron density as a function of depth, and interface and surface roughness. We show that the effect of roughness at a buried interface is only to reduce the visibility of the interference fringes, whereas roughness at the top surface leads also to an overall increase in the rate of fall of intensity with angle (or energy). These two contributions can then be readily distinguished.Most work has been performed in monochromatic angular dispersive mode. We present here a preliminary study of the application of the high-energy, fixed-angle, energy dispersive mode for the study of thin epitaxial layers, Langmuir-Blodgett films, surface damage on silicon chemi-sol polished wafers and ion implanted silicon and aluminium. Data has been analysed using the theory of Parratt, which we have adapted for use in the energy dispersive method.

Energy-Dispersive X-ray Fluorescence Analysis as a Rapid Method for Identifying Tephras

1983 ◽  
Vol 19 (2) ◽  
pp. 201-211 ◽  
Author(s):  
A. B. Cormie ◽  
D. E. Nelson
Keyword(s):  
Reliable Method ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
Bulk Glass ◽  
X Ray ◽  
Additional Tool ◽  
White River ◽  
Routine Identification ◽  
Weathering Effects ◽  
Mount St Helens

AbstractThe use of energy-dispersive X-ray fluorescence analysis (XES) for the routine identification of three tephras (Mazama, Bridge River, Mount St. Helens Yn) commonly found in archeological sites in British Columbia has been investigated. Researchers have often assumed that chemical analysis of bulk samples of glass separates would be hampered by contamination and weathering effects. Our results indicate that XES of bulk glass separates provides a very reliable method for rapidly identifying the three tephras in question, even with a very simple sample preparation. This should enable persons not skilled in geology or in tephrochronology to collect and to identify samples of these tephras. Finally, as a part of the study, similar measurements were made on the separated glass portions of these three tephras and of three others (Glacier Peak B and G, White River) from northwest North America. The results suggest that this method may provide tephrochronologists with a useful additional tool for studying tephras in other regions.

Phase composition depth profiles using spatially resolved energy dispersive X-ray diffraction

2004 ◽  
Vol 37 (6) ◽  
pp. 967-976 ◽  
Author(s):  
Andrew C. Jupe ◽  
Stuart R. Stock ◽  
Peter L. Lee ◽  
Nikhila N. Naik ◽  
Kimberly E. Kurtis ◽  
...  
Keyword(s):  
Phase Composition ◽  
Spatial Resolution ◽  
Zinc Coating ◽  
High Energy ◽  
Sulfate Attack ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Spatially Resolved ◽  
Composition Profiles

Spatially resolved energy dispersive X-ray diffraction, using high-energy synchrotron radiation (∼35–80 keV), was used nondestructively to obtain phase composition profiles along the radii of cylindrical cement paste samples to characterize the progress of the chemical changes associated with sulfate attack on the cement. Phase distributions were acquired to depths of ∼4 mm below the specimen surface with sufficient spatial resolution to discern features less than 200 µm thick. The experimental and data analysis methods employed to obtain quantitative composition profiles are described. The spatial resolution that could be achieved is illustrated using data obtained from copper cylinders with a thin zinc coating. The measurements demonstrate that this approach is useful for nondestructively visualizing the sometimes complex transformations that take place during sulfate attack on cement-based materials. These transformations can be spatially related to microstructure as seen by computed microtomography.

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