Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison

Melanie. J. Bailey; Nicholas J. Bright; Ruth S. Croxton; Simona Francese; Leesa S. Ferguson; Stephen Hinder; Sue Jickells; Benjamin J. Jones; Brian N. Jones; Sergei G. Kazarian; Jesus J. Ojeda; Roger P. Webb; Rosalind Wolstenholme; Stephen Bleay

doi:10.1021/ac302441y

Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison

Analytical Chemistry ◽

10.1021/ac302441y ◽

2012 ◽

Vol 84 (20) ◽

pp. 8514-8523 ◽

Cited By ~ 59

Author(s):

Melanie. J. Bailey ◽

Nicholas J. Bright ◽

Ruth S. Croxton ◽

Simona Francese ◽

Leesa S. Ferguson ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

Attenuated Total Reflection ◽

Gas Chromatography Mass Spectrometry ◽

Ionization Time ◽

Infrared Spectroscopic Imaging ◽

Secondary Ion

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Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/0040-6090(80)90552-0 ◽

1980 ◽

Vol 72 (1) ◽

pp. 3-8 ◽

Cited By ~ 2

Author(s):

C.R. Brundle

Keyword(s):

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

X Ray ◽

Surfaces And Interfaces ◽

Industrial Materials ◽

Secondary Ion

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Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

Surface and Interface Analysis ◽

10.1002/sia.1101 ◽

2001 ◽

Vol 31 (8) ◽

pp. 724-733 ◽

Cited By ~ 94

Author(s):

Caren D. Tidwell ◽

David G. Castner ◽

Stephen L. Golledge ◽

Buddy D. Ratner ◽

Klaus Meyer ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface Characterization of Three Marine Bacterial Strains by Fourier Transform IR, X-ray Photoelectron Spectroscopy, and Time-of-Flight Secondary-Ion Mass Spectrometry, Correlation with Adhesion on Stainless Steel Surfaces

The Journal of Physical Chemistry B ◽

10.1021/jp044705p ◽

2005 ◽

Vol 109 (19) ◽

pp. 9540-9549 ◽

Cited By ~ 36

Author(s):

C. M. Pradier ◽

C. Rubio ◽

C. Poleunis ◽

P. Bertrand ◽

P. Marcus ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Surface Characterization ◽

Secondary Ion Mass Spectrometry ◽

Bacterial Strains ◽

X Ray ◽

Fourier Transform Ir ◽

Steel Surfaces ◽

Secondary Ion

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Secondary ion mass spectrometry/digital imaging for the three‐dimensional chemical characterization of solid state devices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573263 ◽

1985 ◽

Vol 3 (6) ◽

pp. 2102-2107 ◽

Cited By ~ 16

Author(s):

S. R. Bryan ◽

W. S. Woodward ◽

R. W. Linton ◽

D. P. Griffis

Keyword(s):

Mass Spectrometry ◽

Solid State ◽

Digital Imaging ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Chemical Characterization ◽

Solid State Devices ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical characterization of industrial steel and aluminium sheet surfaces by secondary ion mass spectrometry, glow discharge optical spectroscopy and other surface-sensitive techniques

Materials Science and Engineering ◽

10.1016/0025-5416(80)90040-3 ◽

1980 ◽

Vol 42 ◽

pp. 309-320 ◽

Cited By ~ 28

Author(s):

E. Janssen

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Optical Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

Aluminium Sheet ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface characterization of 2-hydroxyethyl methacrylate/styrene copolymers by angle-dependent X-ray photoelectron spectroscopy and static secondary ion mass spectrometry

Journal of Biomaterials Science Polymer Edition ◽

10.1163/156856292x00448 ◽

1992 ◽

Vol 3 (6) ◽

pp. 463-480 ◽

Cited By ~ 14

Author(s):

D.G. Castner ◽

B.D. Ratner ◽

D.W. Grainger ◽

S.W. Kim ◽

T. Okano ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Surface Characterization ◽

Secondary Ion Mass Spectrometry ◽

Hydroxyethyl Methacrylate ◽

X Ray ◽

Styrene Copolymers ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of Insulin Adsorption in the Presence of Albumin by Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Langmuir ◽

10.1021/la701850p ◽

2008 ◽

Vol 24 (2) ◽

pp. 458-464 ◽

Cited By ~ 11

Author(s):

M. Henry ◽

C. Dupont-Gillain ◽

P. Bertrand

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽

10.1039/c6ra17954a ◽

2016 ◽

Vol 6 (84) ◽

pp. 80649-80654 ◽

Cited By ~ 5

Author(s):

Wenjing Xie ◽

Kai Mo Ng ◽

Lu-Tao Weng ◽

Chi-Ming Chan

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Graphite Powder ◽

X Ray ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

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Characterization of Protein G B1 Immobilized Gold Nanoparticles using Time of Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Microscopy and Microanalysis ◽

10.1017/s1431927616002580 ◽

2016 ◽

Vol 22 (S3) ◽

pp. 346-347 ◽

Cited By ~ 1

Author(s):

Yung-Chen Wang ◽

David G. Castner

Keyword(s):

Mass Spectrometry ◽

Gold Nanoparticles ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Protein G ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

ACS Applied Energy Materials ◽

10.1021/acsaem.0c01333 ◽

2020 ◽

Vol 3 (9) ◽

pp. 8822-8832

Author(s):

Laura Wheatcroft ◽

Nico Klingner ◽

René Heller ◽

Gregor Hlawacek ◽

Doğan Özkaya ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Characterization ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Secondary Ion

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