In Situ Characterization of Cloud Condensation Nuclei, Interstitial, and Background Particles Using the Single Particle Mass Spectrometer, SPLAT II†

2010 ◽  
Vol 82 (19) ◽  
pp. 7943-7951 ◽  
Author(s):  
Alla Zelenyuk ◽  
Dan Imre ◽  
Michael Earle ◽  
Richard Easter ◽  
Alexei Korolev ◽  
...  
Keyword(s):  
Mass Spectrometer ◽  
Single Particle ◽  
Cloud Condensation Nuclei ◽  
Particle Mass ◽  
Condensation Nuclei ◽  
In Situ Characterization

Characterization of surgical aerosols by the compact single-particle mass spectrometer LAMPAS 3

2011 ◽  
Vol 401 (10) ◽  
pp. 3165-3172 ◽  
Author(s):  
K.-P. Hinz ◽  
E. Gelhausen ◽  
K.-C. Schäfer ◽  
Z. Takats ◽  
B. Spengler
Keyword(s):  
Mass Spectrometer ◽  
Single Particle ◽  
Particle Mass

Preparation and in Situ Characterization of Surfaces Using Soft Landing in a Fourier Transform Ion Cyclotron Resonance Mass Spectrometer

2005 ◽  
Vol 77 (11) ◽  
pp. 3452-3460 ◽  
Author(s):  
Jormarie Alvarez ◽  
R. Graham Cooks ◽  
S. E. Barlow ◽  
Daniel J. Gaspar ◽  
Jean H. Futrell ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Mass Spectrometer ◽  
Cyclotron Resonance ◽  
Ion Cyclotron Resonance ◽  
Soft Landing ◽  
In Situ Characterization ◽  
Ion Cyclotron

In situ characterization of atomic layer deposition processes by a mass spectrometer

1999 ◽  
Vol 09 (PR8) ◽  
pp. Pr8-1021-Pr8-1028 ◽  
Author(s):  
M. Ritala ◽  
M. Juppo ◽  
K. Kukli ◽  
A. Rahtu ◽  
M. Leskelä
Keyword(s):  
Atomic Layer Deposition ◽  
Mass Spectrometer ◽  
Atomic Layer ◽  
In Situ Characterization ◽  
Layer Deposition ◽  
Deposition Processes
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