Preparation and in Situ Characterization of Surfaces Using Soft Landing in a Fourier Transform Ion Cyclotron Resonance Mass Spectrometer
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1996 ◽
Vol 7
(11)
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pp. 1138-1143
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2012 ◽
2004 ◽
Vol 47
(5)
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pp. 326-334
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1993 ◽
Vol 124
(3)
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pp. 223-239
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1991 ◽
Vol 95
(2)
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pp. 197-198
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