Preparation and in Situ Characterization of Surfaces Using Soft Landing in a Fourier Transform Ion Cyclotron Resonance Mass Spectrometer

2005 ◽  
Vol 77 (11) ◽  
pp. 3452-3460 ◽  
Author(s):  
Jormarie Alvarez ◽  
R. Graham Cooks ◽  
S. E. Barlow ◽  
Daniel J. Gaspar ◽  
Jean H. Futrell ◽  
...  
2006 ◽  
Vol 78 (17) ◽  
pp. 6133-6139 ◽  
Author(s):  
Ryan C. Shea ◽  
Christopher J. Petzold ◽  
J. Larry Campbell ◽  
Sen Li ◽  
David J. Aaserud ◽  
...  

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