High Throughput X-ray Diffraction Analysis of Combinatorial Polycrystalline Thin Film Libraries

2010 ◽  
Vol 82 (11) ◽  
pp. 4564-4569 ◽  
Author(s):  
Scilla Roncallo ◽  
Omeed Karimi ◽  
Keith D. Rogers ◽  
John M. Gregoire ◽  
David W. Lane ◽  
...  
Author(s):  
Nadine Candoni ◽  
Romain Grossier ◽  
Mehdi Lagaize ◽  
Stéphane Veesler

This review compares droplet-based microfluidic systems used to study crystallization fundamentals in chemistry and biology. An original high-throughput droplet-based microfluidic platform is presented. It uses nanoliter droplets, generates a chemical library, and directly solubilizes powder, thus economizing both material and time. It is compatible with all solvents without the need for surfactant. Its flexibility permits phase diagram determination and crystallization studies (screening and optimizing experiments) and makes it easy to use for nonspecialists in microfluidics. Moreover, it allows concentration measurement via ultraviolet spectroscopy and solid characterization via X-ray diffraction analysis.


1997 ◽  
Vol 251 (1-2) ◽  
pp. 65-69 ◽  
Author(s):  
G. Linker ◽  
D. Hüttner ◽  
O. Meyer ◽  
M. Ohkubo ◽  
J. Reiner

2007 ◽  
Vol 22 (4) ◽  
pp. 319-323 ◽  
Author(s):  
Jianfeng Fang ◽  
Jing Huo ◽  
Jinyuan Zhang ◽  
Yi Zheng

The structure of a chemical-vapor-deposited (CVD) diamond thin film on a Mo substrate was studied using quasi-parallel X-ray and glancing incidence techniques. Conventional X-ray diffraction analysis revealed that the sample consists of a diamond thin film, a Mo2C transition layer, and Mo substrate. The Mo2C transition layer was formed by a chemical reaction between the diamond film and the Mo substrate during the CVD process. A method for layer-thickness determination of the thin film and the transition layer was developed. This method was based on a relationship between X-ray diffraction intensities from the transition layer or its substrate and a function of grazing incidence angles. Results of glancing incidence X-ray diffraction analysis showed that thicknesses of the diamond thin film and the Mo2C transition layer were determined successfully with high precision.


2020 ◽  
Vol MA2020-01 (2) ◽  
pp. 328-328
Author(s):  
Scott A Speakman ◽  
Marco Sommariva ◽  
Milen Gateshki ◽  
Fabio Masiello ◽  
Thomas Degen

2016 ◽  
pp. 45-54 ◽  
Author(s):  
LD Connor ◽  
PM Mignanelli ◽  
S Guérin ◽  
JP Soulié ◽  
C Mormiche ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document